公开(公告)号：US20230062971A1

公开(公告)日：2023-03-02

申请号：US17901234

申请日：2022-09-01

Applicant: General Electric Company

Inventor： Megha Navalgund ,  Adam J. McCann ,  Thomas D. Citriniti ,  Kirk Lars Bruns ,  Saravana Kumar S ,  Hiroyuki Tanaka ,  Venkata Dharma Surya Narayana Sastry Rachakonda ,  V S S Srivatsa Ponnada ,  Pär Arumskog ,  Simon Blomé

IPC: B22F10/85 ,  B33Y50/02 ,  B22F10/34 ,  B22F12/90 ,  B22F12/00 ,  B22F12/67

Abstract: Systems, apparatus, computer-readable medium, and associated methods to monitor, analyze, and adjust at least one of 1) additive machine health and configuration or 2) build health and configuration are disclosed. An example apparatus includes an analytics processor, separate from and in a trusted relationship with an additive manufacturing machine building a part, to process, based on a trigger, data from monitoring of the additive manufacturing machine and the build of the part, the analytics processor including a hybrid model fusing additive process physics and data science to process the data to identify an abnormality in at least one of the build or the additive manufacturing machine and to adjust a configuration of the additive manufacturing machine during the build to address the abnormality.