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公开(公告)号：US20240331128A1
公开(公告)日：2024-10-03
申请号：US18194109
申请日：2023-03-31
Applicant: General Electric Company
Inventor： John Karigiannis , Shaopeng Liu , James Vradenburg Miller , Peihong Zhu , David Cantin , Jonathan R. Hootman
IPC: G06T7/00 , G01N21/91 , G06N3/045 , G06N3/0464
CPC classification number: G06T7/0004 , G01N21/91 , G06N3/045 , G06N3/0464 , G06T2207/20081 , G06T2207/20084 , G06T2207/30164
Abstract: A control circuit can access inspection results from an inspection of a first component and then input those inspection results to a first machine learning model. The inspection results include potential wear indications. By one approach, that first machine learning model is trained using a training corpus that includes inspection results for previously inspected components that are at least similar to the first component. The first machine learning model can output assessment information that, by one approach, identifies some of the potential wear indications as being relevant. By one approach, the aforementioned assessment information may be input a second machine learning model that is trained using a training corpus that includes historical results from previous inspections of the same first component and wherein the second machine learning model outputs prediction information regarding whether a repeated physical processing of the first component will yield a particular result.
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Patent Agency Ranking
公开(公告)号：US20190143523A1
公开(公告)日：2019-05-16
申请号：US15814965
申请日：2017-11-16
Applicant: General Electric Company
Inventor： Stephane Harel , Steeves Bouchard , John Karigiannis , Antoine Lizotte , MarcAndre Montplaisir , Nicolas Saudrais , David Cantin
Abstract: A system includes a first sensor having a fixed location relative to a workspace, a second sensor, at least one robotic manipulator coupled to a manipulation tool, and a control system in communication with the at least one robotic manipulator. The control system is configured to determine a location of a workpiece in the workspace based on first sensor data from the first sensor and a three-dimensional (3D) model corresponding to the workpiece. The control system is configured to map a set of 2D coordinates from a second 2D image from the second sensor to a set of 3D coordinates based on the location, and to generate one or more control signals for the at least one robotic manipulator based on the set of 3D coordinates.
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公开(公告)号：US11504853B2
公开(公告)日：2022-11-22
申请号：US15814965
申请日：2017-11-16
Applicant: General Electric Company
Inventor： Stephane Harel , Steeves Bouchard , John Karigiannis , Antoine Lizotte , MarcAndre Montplaisir , Nicolas Saudrais , David Cantin
Abstract: A system includes a first sensor having a fixed location relative to a workspace, a second sensor, at least one robotic manipulator coupled to a manipulation tool, and a control system in communication with the at least one robotic manipulator. The control system is configured to determine a location of a workpiece in the workspace based on first sensor data from the first sensor and a three-dimensional (3D) model corresponding to the workpiece. The control system is configured to map a set of 2D coordinates from a second 2D image from the second sensor to a set of 3D coordinates based on the location, and to generate one or more control signals for the at least one robotic manipulator based on the set of 3D coordinates.
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公开(公告)号：US10060857B1
公开(公告)日：2018-08-28
申请号：US15814880
申请日：2017-11-16
Applicant: General Electric Company
Inventor： Steeves Bouchard , Stephane Harel , John Karigiannis , Nicolas Saudrais , David Cantin , Ser Nam Lim , Maxime Beaudoin Pouliot , Jean-Philippe Choiniere
IPC: B25J9/18 , G01N21/88 , G01N21/954 , G01S17/89 , G01S7/481
CPC classification number: G01N21/8851 , B25J9/1697 , B25J11/00 , G01N21/88 , G01N21/91 , G01N21/9515 , G01N21/954 , G01N2021/9544 , G01N2021/9548 , G01S7/4815 , G01S7/4817 , G01S17/89
Abstract: A system includes one or more processors configured to create a projection matrix based on a three-dimensional (3D) model of a part and sensor data associated with a workpiece in a workspace of a robotic manipulator. The projection matrix provides a mapping between sensor coordinates associated with the sensor data and 3D coordinates associated with the 3D model. The one or more processors are configured to identify a set of sensor coordinates from the sensor data corresponding to a feature indication associated with the workpiece, and to determine from the set of sensor coordinates a set of 3D coordinates using the projection matrix.
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公开(公告)号：US10726543B2
公开(公告)日：2020-07-28
申请号：US16201480
申请日：2018-11-27
Applicant: General Electric Company
Inventor： Xiao Bian , Steeves Bouchard , David Cantin , Stephane Harel , John Karigiannis , David Scott Diwinsky , Bernard Bewlay
Abstract: An inspection system includes one or more processors that obtain a first image of a work piece that has a fluorescent dye thereon in an ultraviolet (UV) light setting and a second image of the work piece in a visible light setting. The first and second images are generated by one or more imaging devices in the same position relative to the work piece. The one or more processors identify a candidate region of the first image based on a light characteristic of one or more pixels, and determine a corresponding candidate region of the second image that is at an analogous location as the candidate region of the first image. The one or more processors analyze both candidate regions to detect a potential defect on a surface of the work piece and a location of the potential defect relative to the surface of the work piece.
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公开(公告)号：US20200167905A1
公开(公告)日：2020-05-28
申请号：US16201480
申请日：2018-11-27
Applicant: General Electric Company
Inventor： Xiao Bian , Steeves Bouchard , David Cantin , Stephane Harel , John Karigiannis , David Scott Diwinsky , Bernard Bewlay
Abstract: An inspection system includes one or more processors that obtain a first image of a work piece that has a fluorescent dye thereon in an ultraviolet (UV) light setting and a second image of the work piece in a visible light setting. The first and second images are generated by one or more imaging devices in the same position relative to the work piece. The one or more processors identify a candidate region of the first image based on a light characteristic of one or more pixels, and determine a corresponding candidate region of the second image that is at an analogous location as the candidate region of the first image. The one or more processors analyze both candidate regions to detect a potential defect on a surface of the work piece and a location of the potential defect relative to the surface of the work piece.
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