公开(公告)号：US09655580B2

公开(公告)日：2017-05-23

申请号：US14920991

申请日：2015-10-23

Applicant: GENERAL ELECTRIC COMPANY

Inventor： Yannan Jin ,  Bruno Kristiaan Bernard De Man ,  Ge Wang ,  Yan Xi

IPC: G06K9/00 ,  A61B6/00 ,  A61B6/03 ,  G06T5/00 ,  G06T5/50 ,  G06T11/00

CPC classification number: A61B6/5258 ,  A61B6/03 ,  A61B6/482 ,  A61B6/5205 ,  G06T5/005 ,  G06T5/50 ,  G06T11/005 ,  G06T2207/10081 ,  G06T2207/10144 ,  G06T2207/20221 ,  G06T2207/30004 ,  G06T2211/408

Abstract: A method includes receiving, with at least one processor, a first projection dataset corresponding to X-rays at a first energy level projected towards a subject at a first set of view angles and receiving, with the at least one processor, a second projection dataset corresponding to X-rays at a second energy level projected towards the subject at a second set of view angles. The method further includes identifying, with the at least one processor, a metal trace from at least one of the first projection dataset and the second projection dataset. Moreover, the method includes converting, with the at least one processor, at least a portion of the first projection dataset to a pseudo dataset at the second energy level. The method also includes generating, with the at least one processor, a final image of the subject based on the second projection dataset, the pseudo dataset, and the metal trace.

公开(公告)号：US20160117850A1

公开(公告)日：2016-04-28

申请号：US14920991

申请日：2015-10-23

Applicant: GENERAL ELECTRIC COMPANY

Inventor： Yannan Jin ,  Bruno Kristiaan Bernard De Man ,  Ge Wang ,  Yan Xi

IPC: G06T11/00 ,  G06T5/00 ,  A61B6/00

CPC classification number: A61B6/5258 ,  A61B6/03 ,  A61B6/482 ,  A61B6/5205 ,  G06T5/005 ,  G06T5/50 ,  G06T11/005 ,  G06T2207/10081 ,  G06T2207/10144 ,  G06T2207/20221 ,  G06T2207/30004 ,  G06T2211/408

Abstract: A method includes receiving, with at least one processor, a first projection dataset corresponding to X-rays at a first energy level projected towards a subject at a first set of view angles and receiving, with the at least one processor, a second projection dataset corresponding to X-rays at a second energy level projected towards the subject at a second set of view angles. The method further includes identifying, with the at least one processor, a metal trace from at least one of the first projection dataset and the second projection dataset. Moreover, the method includes converting, with the at least one processor, at least a portion of the first projection dataset to a pseudo dataset at the second energy level. The method also includes generating, with the at least one processor, a final image of the subject based on the second projection dataset, the pseudo dataset, and the metal trace.

Abstract translation: 一种方法包括：利用至少一个处理器，以在第一组视角投射到对象的第一能级对应于对应于X射线的第一投影数据集，并且与所述至少一个处理器接收第二投影数据集 对应于在第二组视角下朝向对象投射的第二能级的X射线。 该方法还包括用至少一个处理器识别来自第一投影数据集和第二投影数据集中的至少一个的金属迹线。 而且，该方法包括：利用至少一个处理器将第一投影数据集的至少一部分转换为第二能级的伪数据集。 该方法还包括基于第二投影数据集，伪数据集和金属迹线与至少一个处理器生成对象的最终图像。