公开(公告)号：US20230408415A1

公开(公告)日：2023-12-21

申请号：US18455983

申请日：2023-08-25

Applicant: Foss Analytical A/S

Inventor： Daniel ADEN ,  Ahmed FADIL

IPC: G01N21/71

CPC classification number: G01N21/718 ,  G01N2201/06113 ,  G01N2201/068 ,  G01N2201/126

Abstract: A LIBS analysis system comprises a focusing lens arrangement having a focal plane; a laser for propagating a laser beam through the focusing lens arrangement to be focused at the focal plane; a detector for generating an output that is proportional to an intensity of incident electromagnetic radiation that is incident on the detector; a translation mechanism configured to cause a relative movement of the sample holder and the focusing lens arrangement to vary a position of the focal plane along the optical path with respect to the sample holder; and a controller configured to automatically control the translation mechanism to cause the relative movement of the sample holder and the focusing lens arrangement to achieve an optimum position at which the focal plane and an analysis region of the upper surface intersecting the optical path are at or are close to coincidence.

公开(公告)号：US20220146432A1

公开(公告)日：2022-05-12

申请号：US17441910

申请日：2020-04-05

Applicant: Foss Analytical A/S

Inventor： Daniel ADEN ,  Ahmed FADIL

IPC: G01N21/71

Abstract: A LIBS analysis system comprises a focusing lens arrangement having a focal plane; a laser for propagating a laser beam through the focusing lens arrangement to be focused at the focal plane; a detector for generating an output that is proportional to an intensity of incident electromagnetic radiation that is incident on the detector; a translation mechanism configured to cause a relative movement of the sample holder and the focusing lens arrangement to vary a position of the focal plane along the optical path with respect to the sample holder; and a controller configured to automatically control the translation mechanism to cause the relative movement of the sample holder and the focusing lens arrangement to achieve an optimum position at which the focal plane and an analysis region of the upper surface intersecting the optical path are at or are close to coincidence.