公开(公告)号：US08111396B2

公开(公告)日：2012-02-07

申请号：US12225904

申请日：2007-03-12

Applicant: Felix Kerstan ,  Nico Correns ,  Joerg Margraf

Inventor： Felix Kerstan ,  Nico Correns ,  Joerg Margraf

IPC: G01J3/28 ,  G01J3/36

CPC classification number: G01J3/2803 ,  G01J3/0262 ,  G01J3/36 ,  G01J3/51

Abstract: The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point.

Abstract translation: 本解决方案涉及测量系统和用于以高精度确定光谱测量结果的方法。 光谱测量系统包括辐射源，入口狭缝，分散元件和具有在一个或多个平面中以线性或矩阵形式布置的检测器元件的检测器。 检测器在其检测器元件上具有至少两个不同波长选择滤波器的均匀分布。 虽然用于摄影和视频应用的检测器用于此目的，但是本发明的使用不限于可见光谱区域。 此外，可以在制造过程中省略或修改像素上的滤色器。 也可以使用其他类型的检测器，其中波长选择滤波器和相关联的检测器在多个平面中相互排列，其中完整的颜色信息可用于每个单独的图像点。

公开(公告)号：US20090168060A1

公开(公告)日：2009-07-02

申请号：US12225904

申请日：2007-03-12

Applicant: Felix Kerstan ,  Nico Correns ,  Joerg Margraf

Inventor： Felix Kerstan ,  Nico Correns ,  Joerg Margraf

IPC: G01J3/40

CPC classification number: G01J3/2803 ,  G01J3/0262 ,  G01J3/36 ,  G01J3/51

Abstract: The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point.

Abstract translation: 本解决方案涉及测量系统和用于以高精度确定光谱测量结果的方法。 光谱测量系统包括辐射源，入口狭缝，分散元件和具有在一个或多个平面中以线性或矩阵形式布置的检测器元件的检测器。 检测器在其检测器元件上具有至少两个不同波长选择滤波器的均匀分布。 虽然用于摄影和视频应用的检测器用于此目的，但是本发明的使用不限于可见光谱区域。 此外，可以在制造过程中省略或修改像素上的滤色器。 也可以使用其他类型的检测器，其中波长选择滤波器和相关联的检测器在多个平面中相互排列，其中完整的颜色信息可用于每个单独的图像点。

公开(公告)号：US20120105847A1

公开(公告)日：2012-05-03

申请号：US13342317

申请日：2012-01-03

Applicant: Felix KERSTAN ,  Nico Correns ,  Joerg Margraf

Inventor： Felix KERSTAN ,  Nico Correns ,  Joerg Margraf

IPC: G01J3/28

CPC classification number: G01J3/2803 ,  G01J3/0262 ,  G01J3/36 ,  G01J3/51

Abstract: The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point.

Abstract translation: 本解决方案涉及测量系统和用于以高精度确定光谱测量结果的方法。 光谱测量系统包括辐射源，入口狭缝，分散元件和具有在一个或多个平面中以线性或矩阵形式布置的检测器元件的检测器。 检测器在其检测器元件上具有至少两个不同波长选择滤波器的均匀分布。 虽然用于摄影和视频应用的检测器用于此目的，但是本发明的使用不限于可见光谱区域。 此外，可以在制造过程中省略或修改像素上的滤色器。 也可以使用其他类型的检测器，其中波长选择滤波器和相关联的检测器在多个平面中相互排列，其中完整的颜色信息可用于每个单独的图像点。

公开(公告)号：US07082003B2

公开(公告)日：2006-07-25

申请号：US10415213

申请日：2002-03-19

Applicant: Nico Correns ,  Ullrich Klarner ,  Werner Hoyme ,  Felix Kerstan

Inventor： Nico Correns ,  Ullrich Klarner ,  Werner Hoyme ,  Felix Kerstan

IPC: G02B7/02 ,  H01J3/14

CPC classification number: G02B27/0006 ,  G01J3/02 ,  G01J3/0286 ,  G01J5/02 ,  G01J5/0285 ,  G02B7/02

Abstract: In order to provide an arrangement for pressure compensation for optical devices, particularly spectrometers or the like optical devices, for compensating pressure differences caused by changes in temperature and air pressure between the internal pressure and the external pressure at a housing of an optical device enclosing optical units, which arrangement prevents a contamination of optical functional surfaces of the optical units of the optical device and ensures a constant pressure balance between the interior space and the external surroundings of the housing of an optical device with its optical units while economizing on manufacturing costs, it is proposed that the arrangement for pressure compensation comprises at least one pressure compensating element which is constructed on both sides so as to be permeable to air and which is arranged in a housing opening of the housing wall of the optical device enclosing the optical units.

Abstract translation: 为了提供用于光学装置，特别是光谱仪等的光学装置的压力补偿装置，用于补偿由封闭光学装置的光学装置的壳体处的内部压力和外部压力之间的温度和空气压力变化引起的压力差 单元，这种布置防止光学装置的光学单元的光学功能表面的污染，并且通过其光学单元确保光学装置的壳体的内部空间和外部周围之间的恒定的压力平衡，同时节省制造成本， 提出了用于压力补偿的装置包括至少一个压力补偿元件，该压力补偿元件构造在两侧以便能够透过空气并且布置在包围光学单元的光学装置的壳体壁的壳体开口中。

公开(公告)号：US08102526B2

公开(公告)日：2012-01-24

申请号：US12236889

申请日：2008-09-24

Applicant: Jens Hofmann ,  Nico Correns ,  Lutz Freytag ,  Felix Kerstan ,  Doris Jochmann ,  Carsten Ziener ,  Gerhard Foerschler

Inventor： Jens Hofmann ,  Nico Correns ,  Lutz Freytag ,  Felix Kerstan ,  Doris Jochmann ,  Carsten Ziener ,  Gerhard Foerschler

IPC: G01J3/28

CPC classification number: G01J3/02 ,  G01J3/0202 ,  G01J3/0256 ,  G01J3/0291 ,  G01J3/18

Abstract: A spectrometer including an entrance slit and the production of the entrance slit. The spectrometer includes a housing, an entrance slit, and an imaging diffraction grating inside the housing for splitting and imaging the light onto an optoelectric detector. The detector is arranged inside the housing. The housing and the base plate are connected to each other by mutually cooperating positioning members. The entrance slit, the positioning members of the base plate and the holding members for receiving and mounting the detecting device are integral parts of the base plate and are produced from the base plate in a precise manner, in a suitable form and in defined mutual positions by, for example, laser cutting or liquid jet cutting. The positioning members of the base plate and/or the holding members for the detecting device can be provided as resilient elements.

Abstract translation: 光谱仪包括入口狭缝和入口狭缝的产生。 光谱仪包括壳体，入口狭缝和壳体内的成像衍射光栅，用于将光分解和成像到光电检测器上。 检测器布置在壳体内。 壳体和基板通过相互配合的定位构件相互连接。 入口狭缝，基板的定位构件和用于接收和安装检测装置的保持构件是基板的整体部分，并且以适当的形式和相互定义的相互位置以精确的方式从基板制造 通过例如激光切割或液体射流切割。 基板的定位构件和/或检测装置的保持构件可以设置为弹性元件。

公开(公告)号：US20110255075A1

公开(公告)日：2011-10-20

申请号：US13120821

申请日：2009-10-27

Applicant: Felix Kerstan ,  Nico Correns

Inventor： Felix Kerstan ,  Nico Correns

IPC: G01J3/28

CPC classification number: G01J3/28 ,  G01J3/02 ,  G01J3/027 ,  G01J3/0286

Abstract: The invention relates to a spectrometric assembly and method for determining a temperature value for a detector of a spectrometer. It is conventional to record the detector temperature in an optoelectronic detector using a thermal temperature sensor in order to compensate for temperature fluctuations. Due to the finite distance between the detector and the temperature sensor, the accuracy of the temperature detection is limited. According to the invention, the detector temperature should be recordable at high accuracy and with little effort. In addition to means for spectral division of incident tight and an optical detector for spectrally resolved detection of a spectral range of the divided light, a second optical detector is provided for detection of a partial range of this spectral range as a reference detector, wherein sensitivity of the reference detector is substantially temperature-independent. The ratio of the signals of both detectors is a highly accurate measurement for the relative temperature of the first detector due to the temperature independence of the sensitivity of the reference detector, and can be determined with little effort.

Abstract translation: 本发明涉及一种用于确定光谱仪的检测器的温度值的光谱测量组件和方法。 常规的是使用热温度传感器将检测器温度记录在光电检测器中，以补偿温度波动。 由于检测器和温度传感器之间的距离有限，因此温度检测的精度有限。 根据本发明，检测器温度应该能以高精度和很小的努力进行记录。 除了用于入射光谱的光谱分割的装置和用于光谱分辨检测分光的光谱范围的光学检测器之外，提供第二光学检测器用于检测该光谱范围的部分范围作为参考检测器，其中灵敏度 的参考检测器基本上与温度无关。 由于参考检测器的灵敏度的温度独立性，两个检测器的信号的比率是对第一检测器的相对温度的高精度测量，并且可以很少地确定。

公开(公告)号：US07692790B2

公开(公告)日：2010-04-06

申请号：US11382584

申请日：2006-05-10

Applicant: Felix Kerstan ,  Nico Correns

Inventor： Felix Kerstan ,  Nico Correns

IPC: G01J3/42

CPC classification number: G01J3/10 ,  G01J3/02 ,  G01J3/027 ,  G01J3/24 ,  G01J3/36 ,  G01J2003/1286

Abstract: The present invention is directed to a grating spectrometer system for polychromator spectrometer arrangements and monochromator spectrometer arrangements. The grating spectrometer system, according to the invention, comprises a light source for illuminating the sample to be analyzed, a diffraction grating, imaging optical elements, a detector arranged in the image plane, and a controlling and regulating unit. Individual light sources, preferably LEDs having different spectral characteristics, whose spectral range covers a plurality of diffraction orders in the image plane are used as light source. Only those LEDs which do not illuminate the same location of the individual detectors arranged in the image plane in any diffraction order are switched on individually or in groups by the controlling and regulating unit. The proposed solution is suitable for polychromator spectrometer arrangements and for monochromator spectrometer arrangements. The field of application is determined by the spectral sensitivity of the detector that is employed. By using a plurality of diffraction orders, the resolution can be increased with the detector size remaining the same, or the detector surface can be reduced while retaining the same imaging quality.

Abstract translation: 本发明涉及一种用于多色光谱仪布置和单色仪光谱仪布置的光栅光谱仪系统。 根据本发明的光栅光谱仪系统包括用于照射待分析样品的光源，衍射光栅，成像光学元件，布置在图像平面中的检测器以及控制和调节单元。 各个光源，优选具有不同光谱特性的LED，其光谱范围覆盖图像平面中的多个衍射级，被用作光源。 只有那些不以任何衍射级布置在图像平面中的各个检测器的相同位置照明的那些LED由控制和调节单元单独或分组地接通。 所提出的解决方案适用于多色光谱仪布置和单色仪光谱仪布置。 应用领域由采用的检测器的光谱灵敏度决定。 通过使用多个衍射级，可以在检测器尺寸保持相同的情况下提高分辨率，或者可以减小检测器表面，同时保持相同的成像质量。

公开(公告)号：US20070195323A1

公开(公告)日：2007-08-23

申请号：US10559175

申请日：2004-05-21

Applicant: Manfred Fritsch ,  Nico Correns ,  Felix Kerstan

Inventor： Manfred Fritsch ,  Nico Correns ,  Felix Kerstan

IPC: G01J3/28

CPC classification number: G01B11/306 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/024 ,  G01J3/0262 ,  G01J3/04 ,  G01J3/2803

Abstract: The invention is directed to an arrangement for detecting coatings which are arranged on surfaces of structural component parts or objects and for determining the chemical characteristics and surface properties of these coatings. It comprises a light source for illuminating the coating to be analyzed on the surface of the structural component part and means for imaging the light source on an entrance slit over the surface of the coating to be analyzed. The entrance slit is imaged in a wavelength-dependent manner on a two-dimensional detector unit by a grating. An evaluating unit which is electrically connected to the detector unit serves to evaluate and process the signals supplied by the exposed detector elements of the detector unit.

Abstract translation: 本发明涉及一种用于检测涂层的布置，其布置在结构部件或物体的表面上并用于确定这些涂层的化学特性和表面性质。 它包括用于照亮在结构部件表面上待分析的涂层的光源，以及用于将光源成像在待分析涂层的表面上的入口狭缝上的装置。 入射狭缝通过光栅以波长依赖的方式成像在二维检测器单元上。 电连接到检测器单元的评估单元用于评估和处理由检测器单元的暴露的检测器元件提供的信号。

公开(公告)号：US20110007319A1

公开(公告)日：2011-01-13

申请号：US12745158

申请日：2008-12-10

Applicant: Nico Correns ,  Werner Hoyme ,  Felix Kerstan ,  Thomas Keune ,  Wilhelm Schebesta

Inventor： Nico Correns ,  Werner Hoyme ,  Felix Kerstan ,  Thomas Keune ,  Wilhelm Schebesta

IPC: G01N21/55

CPC classification number: G01N21/276 ,  G01N21/4738 ,  G01N2021/4742

Abstract: The invention relates to an arrangement for measuring the reflectivity of the direct or scattered reflection of a sample (8), having a light source for separately lighting the sample (8) and of comparative surfaces. The arrangement comprises, in addition to the light source, preferably a reflector lamp (2), —a white standard (6), a black standard (7), and the surface of the sample (8) for embodying a measurement surface, wherein the exchange of the white standard (6), the black standard (7) and the sample (8) is provided in a prescribed sequence relative to each other, —means for measuring the intensity of the light reflected from an internal white surface (10) and for measuring the intensity of the light reflected from each measuring surface, and—an evaluation circuit designed for registering the measured intensity values and for linking the same mathematically to the reflectivity.

Abstract translation: 本发明涉及一种用于测量样品（8）的直接或散射反射的反射率的装置，其具有用于分别照亮样品（8）和比较表面的光源。 除了光源之外，该装置优选地包括反射灯（2），白色标准（6），黑色标准（7）和用于体现测量表面的样品（8）的表面，其中 以规定的顺序相对于白色标准（6），黑色标准（7）和样品（8）的交换提供 - 用于测量从内部白色表面（10）反射的光的强度 ）并且用于测量从每个测量表面反射的光的强度，以及设计用于记录所测量的强度值并将数学上与反射率相关联的评估电路。

公开(公告)号：US07369228B2

公开(公告)日：2008-05-06

申请号：US10544555

申请日：2003-12-19

Applicant: Felix Kerstan ,  Ullrich Klarner ,  Nico Correns ,  Gregor Tumpach

Inventor： Felix Kerstan ,  Ullrich Klarner ,  Nico Correns ,  Gregor Tumpach

IPC: G01J3/36

CPC classification number: G01J3/02 ,  G01J3/0256 ,  G01J3/0291

Abstract: The present invention is directed to a spectrometer in which the electrical and optical components are connected to one another in a compact construction. A minimal expenditure on assembly and adjustment is achieved through a small quantity of individual parts. The compact spectrometer comprises an entrance slit, an imaging grating, one or more detector elements in rows or matrices, and elements of a controlling and evaluating unit. The detector elements and the entrance slit are arranged on a shared support, the elements of the controlling and evaluating unit being arranged on the free surfaces of the support. The entrance slit and the detector elements and the imaging spherical grating recessed into the spectrometer housing are arranged symmetric to an imaginary center axis of the support. Due to its compact size and the minimized expenditure on adjustment and assembly for its manufacture, the inventive spectrometer has numerous applications.

Abstract translation: 本发明涉及一种其中电气和光学部件以紧凑的结构相互连接的光谱仪。 组装和调整的最小支出是通过少量的个别部件实现的。 紧凑型光谱仪包括入口狭缝，成像光栅，行或矩阵中的一个或多个检测器元件，以及控制和评估单元的元件。 检测器元件和入口狭缝布置在共享支撑件上，控制和评估单元的元件布置在支撑件的自由表面上。 凹入光谱仪壳体的入射狭缝和探测器元件和成像球形光栅与支撑体的假想中心轴线对称。 由于其紧凑的尺寸和用于其制造的调整和组装的最小化的支出，本发明的光谱仪具有许多应用。