公开(公告)号：US09678124B2

公开(公告)日：2017-06-13

申请号：US14496447

申请日：2014-09-25

Applicant: Electronics and Telecommunications Research Institute

Inventor： Hyuk-Je Kim ,  Jong-Moon Lee ,  Seong-Ho Son ,  Soon-Ik Jeon ,  Hyung-Do Choi

IPC: G01R25/00 ,  G01N22/00

CPC classification number: G01R25/00 ,  G01N22/00

Abstract: A phase measurement method in a microwave tomography system may include transmitting a first Tx frequency signal, receiving a signal corresponding to the first Tx frequency signal, and measuring a first phase value; transmitting a second Tx frequency signal separated by a predetermined discrete frequency from the first Tx frequency signal, receiving a signal corresponding to the second Tx frequency signal, and measuring a second phase value; calculating a first phase difference based on a difference between the first and second phase values; calculating a second phase difference based on the discrete frequency; and determining an unwrapped phase value through comparison between the first and second phase differences.