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公开(公告)号：US20240044641A1
公开(公告)日：2024-02-08
申请号：US18487091
申请日：2023-10-15
发明人： David STOUTAMIRE , Dennis HUSSEY
CPC分类号： G01B11/2527 , G06T7/521 , G06T2207/30108
摘要： Provided is a method for measuring surface characteristics of at least a portion of an object, including providing a light source; generating a first interference pattern on the at least a portion of the object; capturing an image of the first interference pattern; shifting the phase of the light source to generate a second interference pattern; capturing an image of the second interference pattern; filtering distortion from the interference patterns; extracting a wrapped phase of the at least a portion of the object based on the images; unwrapping the wrapped phase of the at least a portion of the object to generate an unwrapped phase; identifying a computed depth map distance to the at least a portion of the object; and fitting an ideal part to the computed depth map of the at least a portion of the object to measure the surface characteristics.
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公开(公告)号：US20210389124A1
公开(公告)日：2021-12-16
申请号：US17284470
申请日：2018-10-12
发明人： David STOUTAMIRE , Dennis HUSSEY
摘要： Provided is a method for measuring surface characteristics of at least a portion of an object, including providing a light source; generating a first interference pattern on the at least a portion of the object; capturing an image of the first interference pattern; shifting the phase of the light source to generate a second interference pattern; capturing an image of the second interference pattern; filtering distortion from the interference patterns; extracting a wrapped phase of the at least a portion of the object based on the images; unwrapping the wrapped phase of the at least a portion of the object to generate an unwrapped phase; identifying a computed depth map distance to the at least a portion of the object; and fitting an ideal part to the computed depth map of the at least a portion of the object to measure the surface characteristics.
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