Abstract:
A method for selecting a field device for ascertaining at least one process parameter of a measured material in process and automation technology, especially a process parameter such as flow, fill level, limit level, pressure, temperature, conductivity and/or ion concentration of a measured material, which field device is provided at a measuring point of a plant for ascertaining at least one process parameter, characterized by steps as follows: A identifying a first field device, which is suitable to determine the at least one process parameter of the measured material at the measuring point of the plant; B querying a first data set stored in a data memory relative to product features of the first field device, which enable ascertaining the at least one process parameter; C comparing at least one product feature of the first data set of the first field device with at least one corresponding product feature of a second data set of a second field device; and D specifying the second field device, to the extent that there is partial or complete agreement of the product features of the first and second data sets.
Abstract:
A method for providing information via a computer system for evaluating suitability of a field device of the process industry for a certain application, characterized by steps as follows: a) indicating the application by inputting the measured substance and, in given cases, further properties of the measured substance; b) indicating and/or ascertaining a field device type, which is to be considered for the application; c) providing a database, in which at least one or more evaluations are furnished with reference to one or more on-site reviews of a field device of the input field device type in the indicated application; d) retrieving the evaluation in the database and e) outputting the evaluation relative to the indicated field device in the indicated application.