公开(公告)号：US09207191B2

公开(公告)日：2015-12-08

申请号：US14561336

申请日：2014-12-05

Applicant: Electronics and Telecommunications Research Institute

Inventor： Jang Yeol Kim ,  Jong Moon Lee ,  Hyuk Je Kim ,  Seong Ho Son ,  Soon Ik Jeon

IPC: G01N22/00 ,  A61B6/00

CPC classification number: G01N22/00 ,  A61B5/0507 ,  A61B5/4312 ,  A61B6/44 ,  A61B2560/0252

Abstract: An apparatus and method of controlling a temperature of a matching material used in an apparatus for generating a tomographic image is disclosed. The method includes measuring a temperature of a matching material in which an object is immersed in an apparatus for measuring a shape of an object, setting a set temperature at which an amplitude and a phase of an electromagnetic wave that passes through the matching material are maintained, based on the measured temperature of the matching material, and controlling the temperature of the matching material to be higher than the set temperature.

Abstract translation: 公开了一种用于控制用于生成断层图像的装置中使用的匹配材料的温度的装置和方法。 该方法包括测量物体浸在用于测量物体形状的装置中的匹配材料的温度，设定保持通过匹配材料的电磁波的振幅和相位的设定温度 基于匹配材料的测量温度，并将匹配材料的温度控制为高于设定温度。

公开(公告)号：US10037616B2

公开(公告)日：2018-07-31

申请号：US15249582

申请日：2016-08-29

Applicant: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE

Inventor： Bo Ra Kim ,  Seong Ho Son ,  Simonov Nikolai ,  Soon Ik Jeon

IPC: G06T11/00 ,  A61B5/05

CPC classification number: G06T11/005 ,  A61B5/0507 ,  G06T11/006 ,  G06T2207/10072 ,  G06T2207/30068

Abstract: Provided is an apparatus for reconstructing an image using a microwave. The apparatus includes: a microwave measurement unit configured to obtain a microwave measurement value for a microwave measurement object; and an image reconstruction unit configured to perform an image reconstruction by using the microwave measurement value and shape boundary information of the object.