METHODS OF FORMING A LOW RESISTANCE SILICON-METAL CONTACT
    1.
    发明申请
    METHODS OF FORMING A LOW RESISTANCE SILICON-METAL CONTACT 有权
    形成低电阻硅金属接触的方法

    公开(公告)号:US20100221903A1

    公开(公告)日:2010-09-02

    申请号:US12714941

    申请日:2010-03-01

    CPC classification number: H01L31/022425 Y02E10/50

    Abstract: A method of forming an ohmic contact on a substrate is described. The method includes depositing a set of silicon particles on the substrate surface. The method also includes heating the substrate in a baking ambient to a baking temperature and for a baking time period in order to create a densified film ink pattern. The method further includes exposing the substrate to a dopant source in a diffusion furnace with a deposition ambient, the deposition ambient comprising POCl3, a carrier N2 gas, a main N2 gas, and a reactive O2 gas at a deposition temperature and for a deposition time period, wherein a PSG layer is formed on the substrate surface. The method also includes heating the substrate in a drive-in ambient to a drive-in temperature and for a drive-in time period; and depositing a silicon nitride layer. The method further includes depositing a set of metal contacts on the set of silicon particles; and heating the substrate to a firing temperature and for a firing time period.

    Abstract translation: 描述了在衬底上形成欧姆接触的方法。 该方法包括在衬底表面上沉积一组硅颗粒。 该方法还包括将烘烤环境中的基材加热到烘烤温度和烘烤时间段,以便产生致密的薄膜油墨图案。 该方法还包括在沉积环境中将基板暴露于扩散炉中的掺杂剂源,沉积环境包括POCl 3,载气N2气体,主N 2气体和反应性O 2气体,其沉积温度和沉积时间 周期,其中在基板表面上形成PSG层。 该方法还包括将驱动环境中的衬底加热到​​驱动温度和驱动时间段; 并沉积氮化硅层。 该方法还包括在一组硅颗粒上沉积一组金属触点; 并将基板加热至烧成温度和烧制时间。

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