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公开(公告)号:US11436115B2
公开(公告)日:2022-09-06
申请号:US16541567
申请日:2019-08-15
Inventor: Chin Huat Lim , Ming-Li Shiu , Adisak Paepoot , Narut Udomchoke
IPC: G06F11/00 , G06F11/263 , G06F11/22 , G06F11/36 , G06F11/30
Abstract: The present disclosure discloses a design and test method of a test plan. The test plan includes the plurality of input parameters, the plurality of output parameters, the plurality of system parameters, all of the numerical levels or the types of each input parameter, each output parameter and each system parameter. The test plan includes a plurality of test cases to cover combination conditions including a great number of the input parameters, the output parameters and the system parameters and their dynamic cross of the parameters. The design and test method performs the test cases of the test plan on the product automatically by considering overall possibly parameters and their levels associated with the product. The overall possibly parameters and their levels associated with the product can be tested before the product is dispatched to the customer so as to enhance the product quality.
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公开(公告)号:US20200250057A1
公开(公告)日:2020-08-06
申请号:US16541567
申请日:2019-08-15
Inventor: Chin Huat Lim , Ming-Li Shiu , Adisak Paepoot , Narut Udomchoke
IPC: G06F11/22 , G06F11/36 , G06F11/30 , G06F11/263
Abstract: The present disclosure discloses a design and test method of a test plan. The test plan includes the plurality of input parameters, the plurality of output parameters, the plurality of system parameters, all of the numerical levels or the types of each input parameter, each output parameter and each system parameter. The test plan includes a plurality of test cases to cover combination conditions including a great number of the input parameters, the output parameters and the system parameters and their dynamic cross of the parameters. The design and test method performs the test cases of the test plan on the product automatically by considering overall possibly parameters and their levels associated with the product. The overall possibly parameters and their levels associated with the product can be tested before the product is dispatched to the customer so as to enhance the product quality.
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