公开(公告)号：US20240232140A1

公开(公告)日：2024-07-11

申请号：US18153146

申请日：2023-01-11

申请人： Dell Products L.P.

发明人： Simarjot Kaur ,  Max Laier ,  Dhanashri Parasharam Patil ,  Mayank Rajawat ,  Anton Rang ,  Chris Stacey

IPC分类号： G06F16/185

CPC分类号： G06F16/185

摘要： The described technology is generally directed towards maintaining a heat score per file based on a file's access/activity level, and using the heat score to re-tier files from faster to slower storage and vice-versa. Files on a slower tier that have more activity are thereby moved (“up-tiered”) to a faster access storage tier, while the files that have less activity on the faster access storage tier are moved (“down-tiered”) to a slower access storage tier. The heat score for a file is increased based on more input-output operation activity, and decayed over time. The decaying can be based on a relative importance value (e.g., business value) assigned to the file or a domain that includes the file. Ordering the files based on their respective heat scores allows only a fraction of the files to be considered for re-tiering before the re-tiering moves are performed.

公开(公告)号：US20240086073A1

公开(公告)日：2024-03-14

申请号：US17944270

申请日：2022-09-14

申请人： Dell Products L.P.

发明人： Anton Rang

IPC分类号： G06F3/06

CPC分类号： G06F3/0616 ,  G06F3/0647 ,  G06F3/0679

摘要： A storage system calculates relative writability of SSDs and biases storage of data from write IOs to the SSD that has the greatest relative writability, where writability is a value calculated as a function of remaining wear-life and drive capacity. When the remaining wear-life of an SSD falls below a threshold, unstable data is evicted from that drive, where data stability is an indication of likelihood of data being changed. The drive with the greatest relative writability is selected as the target for the unstable data. The drive with the greatest relative writability is also selected as the donor for stable data that is moved to the free space created by eviction of the unstable data. Consequently, the SSD that triggers the low wear-life threshold processes fewer write IOs.