DEVICE AND METHOD FOR ANALYZING DEFECT IN ULTRASONIC TESTING USING THREE-DIMENSIONAL DEEP LEARNING MODEL

    公开(公告)号:US20240378712A1

    公开(公告)日:2024-11-14

    申请号:US18610339

    申请日:2024-03-20

    Abstract: A device and method for analyzing a defect in ultrasonic testing using a three-dimensional deep learning model is proposed. The method includes preparing three-dimensional raw data by collecting a plurality of two-dimensional inspection images obtained by ultrasonic testing of an inspection object and stacking the plurality of two-dimensional inspection images; generating input data for a deep learning model by processing the three-dimensional raw data; deriving representation data, which is an inferenced three-dimensional image representing the defect of the inspection object, through a first feature transformation by applying first weights in a trained state to the input data within a generation network of the deep learning model; and determining a defect type of the inspection object by inputting the representation data to a detecting network of the deep learning model.

    ANNOTATION DEVICE AND ANNOTATION METHOD
    3.
    发明公开

    公开(公告)号:US20240233420A9

    公开(公告)日:2024-07-11

    申请号:US18468710

    申请日:2023-09-17

    CPC classification number: G06V20/70 G06V10/22

    Abstract: Disclosed is an annotation device including at least one processor. The at least one processor generates a plurality of superpixels in an annotation target image based on a predetermined non-parametric segmentation method, recommends segmentation regions based on outlines of the plurality of superpixels, respectively, and performs labeling for each of the recommended segmentation regions based on a user input for labeling.

    DEVICE FOR DETERMINING OPERATIONAL STATUS OF SENSOR AND METHOD THEREOF

    公开(公告)号:US20240201682A1

    公开(公告)日:2024-06-20

    申请号:US18518483

    申请日:2023-11-23

    CPC classification number: G05B23/0283 G05B23/024 G05B23/0254

    Abstract: Disclosed is a device for determining the operational status of a sensor configured to: determine initial parameters of a Bayesian model and a degree of a polynomial regression model based on historical data of a target sensor and a reference sensor; infer a posterior distribution of a regression coefficient and an error term of a regression curve using the polynomial regression model and the Bayesian model; set a credible interval based on the posterior distribution of the regression coefficient and the error term of the regression curve, and set control lines of data of the target sensor using the credible interval; determine an accuracy of the target sensor based on current data of the target sensor and the set control line; and control an operational status of the target sensor based on the accuracy.

    ANNOTATION DEVICE AND ANNOTATION METHOD
    7.
    发明公开

    公开(公告)号:US20240135738A1

    公开(公告)日:2024-04-25

    申请号:US18468710

    申请日:2023-09-16

    CPC classification number: G06V20/70 G06V10/22

    Abstract: Disclosed is an annotation device including at least one processor. The at least one processor generates a plurality of superpixels in an annotation target image based on a predetermined non-parametric segmentation method, recommends segmentation regions based on outlines of the plurality of superpixels, respectively, and performs labeling for each of the recommended segmentation regions based on a user input for labeling.

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