公开(公告)号：US20250095149A1

公开(公告)日：2025-03-20

申请号：US18964686

申请日：2024-12-02

Applicant: DEEP BIO INC.

Inventor： Tae Yeong KWAK ,  Jae Heon LEE ,  Hye Yoon CHANG ,  Sun Woo KIM

IPC: G06T7/00 ,  G06T7/11 ,  G16H30/40 ,  G16H50/30 ,  G16H70/60

Abstract: A patch level severity determination method, a slide level severity determination method, and a computing system for performing same are disclosed. According to one aspect of the present invention, provided is a method performed in a computing system including a deep-learning model pre-trained to provide determination results for partial images when each partial image obtained by dividing a pathology slide image is inputted, the method comprising the steps of: for each of a plurality of partial images obtained by dividing a pathology slide image, determining an effective grade for the partial image on the basis of a determination result for the partial image outputted by the deep-learning model that has received the partial image; and determining a slide level severity rating for the entire pathology slide image on the basis of the effective grade for each of the plurality of partial images that constitute the pathology slide image.