公开(公告)号：US20210176159A1

公开(公告)日：2021-06-10

申请号：US17182531

申请日：2021-02-23

申请人： Contec, LLC

发明人： Samant Kumar ,  Shivashankar Diddimani ,  Hemanth Nekkileru ,  James Christopher Collip ,  Naresh Chandra Nigam ,  Mrinal Mathur

IPC分类号： H04L12/26 ,  H04L12/28

摘要： A hardware architecture for a universal testing system used for performing tests on cable modem devices (DUT) is disclosed. According to certain embodiments, a CMTS test harness enables the DUT to respond to test phone calls from the MOCA interface and which test phone calls terminate at the DUT's phone port.

公开(公告)号：US20170126539A1

公开(公告)日：2017-05-04

申请号：US15348920

申请日：2016-11-10

申请人： Contec, LLC

发明人： Rajeev Tiwari ,  Mrinal Mathur

IPC分类号： H04L12/26 ,  H04L12/28

CPC分类号： H04L43/50 ,  H04L12/2801

摘要： A system may include a master test system and a plurality of slave test systems coupled to the master test system and/or each other. The system may include devices under test (DUTs) (also referred to herein as units under test (UUTs)) stored in test slots and coupled to the master test system or specific slave test systems over Ethernet, coaxial, or other cables. Each test slot may include a Faraday cage that shields the contents therein from electromagnetic signals outside the test slot. The master test system and/or the slave test systems may test the DUTs using specific sequences of tests according to testing protocols relevant to those DUTs. One or more test controllers, mobile devices, display devices, and/or input devices may be coupled to the test systems and be used to control specific test protocols performed by the test systems.

公开(公告)号：US20190273675A1

公开(公告)日：2019-09-05

申请号：US16415604

申请日：2019-05-17

申请人： Contec, LLC

发明人： Samant Kumar ,  Shivashankar Diddimani ,  Hemanth Nekkileru ,  James Christopher Collip ,  Naresh Chandra Nigam ,  Mrinal Mathur

IPC分类号： H04L12/26 ,  H04L12/28

摘要： A hardware architecture for a universal testing system used for performing tests on cable modem devices (OUT) is disclosed. According to certain embodiments, a CMTS test harness enables the DUT to respond to test phone calls from the MOCA interface and which test phone calls terminate at the DUT's phone port.

公开(公告)号：US20170250762A1

公开(公告)日：2017-08-31

申请号：US15057085

申请日：2016-02-29

申请人： Contec, LLC

发明人： Samant Kumar ,  Shivashankar Diddimani ,  Hemanth Nekkileru ,  James Christopher Collip ,  Naresh Chandra Nigam ,  Mrinal Mathur

IPC分类号： H04B17/16

CPC分类号： H04B17/16 ,  H04L43/50 ,  Y04S40/168

摘要： A universal testing system platform with a modular and symmetrical design that provides a flexible, efficient and space saving architecture for testing wireless devices is disclosed.

公开(公告)号：US10158553B2

公开(公告)日：2018-12-18

申请号：US15624967

申请日：2017-06-16

申请人： Contec, LLC

发明人： Rajeev Tiwari ,  Mrinal Mathur

IPC分类号： H04L12/26 ,  H04L12/28

摘要： A system may include a master test system and a plurality of slave test systems coupled to the master test system and/or each other. The system may include devices under test (DUTs) (also referred to herein as units under test (UUTs)) stored in test slots and coupled to the master test system or specific slave test systems over Ethernet, coaxial, or other cables. Each test slot may include a Faraday cage that shields the contents therein from electromagnetic signals outside the test slot. The master test system and/or the slave test systems may test the DUTs using specific sequences of tests according to testing protocols relevant to those DUTs. One or more test controllers, mobile devices, display devices, and/or input devices may be coupled to the test systems and be used to control specific test protocols performed by the test systems.

公开(公告)号：US20180076908A1

公开(公告)日：2018-03-15

申请号：US15818803

申请日：2017-11-21

申请人： Contec, LLC

发明人： Samant Kumar ,  Shivashankar Diddimani ,  James Christopher Collip ,  Mrinal Mathur ,  Hemanth Chandra Nekkileru ,  Naresh Chandra Nigam

IPC分类号： H04B17/16

CPC分类号： H04B17/16 ,  H04L43/50 ,  Y04S40/168

摘要： A universal testing system platform with a modular and symmetrical design that provides faraday cages in a flexible, efficient and space saving architecture for testing wireless devices.

公开(公告)号：US20170126536A1

公开(公告)日：2017-05-04

申请号：US14929180

申请日：2015-10-30

申请人： Contec, LLC

发明人： Samant Kumar ,  Shivashankar Diddimani ,  Hemanth Nekkileru ,  James Christopher Collip ,  Naresh Chandra Nigam ,  Mrinal Mathur

IPC分类号： H04L12/26 ,  H04L12/28

CPC分类号： H04L43/50 ,  H04L12/2801 ,  H04L12/2885

摘要： A hardware architecture for a universal testing system used for performing tests on cable modem devices (DUT) is disclosed. According to certain embodiments, a CMTS test harness enables the DUT to respond to test phone calls from the MOCA interface and which test phone calls terminate at the DUT's phone port.

公开(公告)号：US10581719B2

公开(公告)日：2020-03-03

申请号：US16400512

申请日：2019-05-01

申请人： Contec, LLC

发明人： Samant Kumar ,  Shivashankar Diddimani ,  Hemanth Nekkileru ,  James Christopher Collip ,  Naresh Chandra Nigam ,  Mrinal Mathur

IPC分类号： H04L12/26 ,  H04L12/413 ,  H04L12/28

摘要： A hardware architecture for a universal testing system used for performing Wifi tests on wireless devices under test (DUT) is disclosed. According to certain embodiments, test information travels from a Wifi port of the test server to the Wifi port's antenna in a Faraday cage, and then travels over the air to DUT's Wifi antenna in the same Faraday cage, and then to a LAN Ethernet port of the DUT, and then to the test server's Ethernet port.

公开(公告)号：US10320651B2

公开(公告)日：2019-06-11

申请号：US14929220

申请日：2015-10-30

申请人： Contec, LLC

发明人： Samant Kumar ,  Shivashankar Diddimani ,  Hemanth Nekkileru ,  James Christopher Collip ,  Naresh Chandra Nigam ,  Mrinal Mathur

IPC分类号： H04L12/26 ,  H04L12/28 ,  H04L12/413

摘要： A hardware architecture for a universal testing system used for performing Wifi tests on wireless devices under test (DUT) is disclosed. According to certain embodiments, test information travels from a Wifi port of the test server to the Wifi port's antenna in a Faraday cage, and then travels over the air to DUT's Wifi antenna in the same Faraday cage, and then to a LAN Ethernet port of the DUT, and then to the test server's Ethernet port.

公开(公告)号：US20170289012A1

公开(公告)日：2017-10-05

申请号：US15624967

申请日：2017-06-16

申请人： Contec, LLC

发明人： Rajeev Tiwari ,  Mrinal Mathur

IPC分类号： H04L12/26 ,  H04L12/28

CPC分类号： H04L43/50 ,  H04L12/2801

摘要： A system may include a master test system and a plurality of slave test systems coupled to the master test system and/or each other. The system may include devices under test (DUTs) (also referred to herein as units under test (UUTs)) stored in test slots and coupled to the master test system or specific slave test systems over Ethernet, coaxial, or other cables. Each test slot may include a Faraday cage that shields the contents therein from electromagnetic signals outside the test slot. The master test system and/or the slave test systems may test the DUTs using specific sequences of tests according to testing protocols relevant to those DUTs. One or more test controllers, mobile devices, display devices, and/or input devices may be coupled to the test systems and be used to control specific test protocols performed by the test systems.