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1.发明授权公开(公告)号：US11686648B2
公开(公告)日：2023-06-27
申请号：US17443280
申请日：2021-07-23
Applicant: Cisco Technology, Inc.
Inventor： Xunyuan Zhang , Ravi S. Tummidi , Tony P. Polous , Mark A. Webster
CPC classification number: G01M11/30 , G02B6/12007 , G02B2006/12061 , G02B2006/12145 , G02B2006/12164
Abstract: Electrical test of optical components via metal-insulator-semiconductor capacitor structures is provided via a plurality of optical devices including a first material embedded in a second material, wherein each optical device is associated with a different thickness range of a plurality of thickness ranges for the first material; a first capacitance measurement point including the first material embedded in the second material; and a second capacitance measurement point including a region from which the first material has been replaced with the second material.
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2.发明授权公开(公告)号：US12276565B2
公开(公告)日：2025-04-15
申请号：US18297412
申请日：2023-04-07
Applicant: Cisco Technology, Inc.
Inventor： Xunyuan Zhang , Ravi S. Tummidi , Tony P. Polous , Mark A Webster
Abstract: Electrical test of optical components via metal-insulator-semiconductor capacitor structures is provided via a plurality of optical devices including a first material embedded in a second material, wherein each optical device is associated with a different thickness range of a plurality of thickness ranges for the first material; a first capacitance measurement point including the first material embedded in the second material; and a second capacitance measurement point including a region from which the first material has been replaced with the second material.
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