公开(公告)号：US20230243718A1

公开(公告)日：2023-08-03

申请号：US18297412

申请日：2023-04-07

Applicant: Cisco Technology, Inc.

Inventor： Xunyuan ZHANG ,  Ravi S. TUMMIDI ,  Tony P. POLOUS ,  Mark A. WEBSTER

IPC: G01M11/00 ,  G02B6/12

CPC classification number: G01M11/30 ,  G02B6/12007 ,  G02B2006/12164 ,  G02B2006/12061 ,  G02B2006/12145

Abstract: Electrical test of optical components via metal-insulator-semiconductor capacitor structures is provided via a plurality of optical devices including a first material embedded in a second material, wherein each optical device is associated with a different thickness range of a plurality of thickness ranges for the first material; a first capacitance measurement point including the first material embedded in the second material; and a second capacitance measurement point including a region from which the first material has been replaced with the second material.

公开(公告)号：US20230022612A1

公开(公告)日：2023-01-26

申请号：US17443280

申请日：2021-07-23

Applicant: Cisco Technology, Inc.

Inventor： Xunyuan ZHANG ,  Ravi S. TUMMIDI ,  Tony P. POLOUS ,  Mark A. WEBSTER

IPC: G01M11/00 ,  G02B6/12

Abstract: Electrical test of optical components via metal-insulator-semiconductor capacitor structures is provided via a plurality of optical devices including a first material embedded in a second material, wherein each optical device is associated with a different thickness range of a plurality of thickness ranges for the first material; a first capacitance measurement point including the first material embedded in the second material; and a second capacitance measurement point including a region from which the first material has been replaced with the second material.