公开(公告)号：US20240219435A1

公开(公告)日：2024-07-04

申请号：US18395276

申请日：2023-12-22

Applicant: CHROMA ATE INC.

Inventor： Jyun-Yi SU ,  Sheng-Shiuan JIAN ,  Ting-Ting CHANG ,  Wen-Yue CHUANG

IPC: G01R19/165

CPC classification number: G01R19/16566

Abstract: A source measure device includes a current sampling circuit, a voltage sampling circuit, an overvoltage detecting circuit, and a comparing circuit. The current sampling circuit is configured to sample a current of a device under test. The voltage sampling circuit is configured to sample a voltage of the device under test. The overvoltage detecting circuit is coupled to the current sampling circuit and the voltage sampling circuit, and receives a first operation voltage of the current sampling circuit and a second operation voltage of the voltage sampling circuit so as to generate a detection voltage. The comparing circuit is coupled to the overvoltage detecting circuit, and determines whether the detection voltage is within a voltage range. If the detection voltage is not within the voltage range, the comparing circuit generates an abnormal signal.