公开(公告)号：US20150066414A1

公开(公告)日：2015-03-05

申请号：US14261427

申请日：2014-04-25

Applicant: CHROMA ATE INC.

Inventor： Chin-Yi Ouyang ,  Liang-Yu Hsu

IPC: G01R31/28

CPC classification number: G01R31/2894 ,  G01R31/287

Abstract: An automatic retest method for a system-level IC test equipment and the IC test equipment is disclosed, wherein the IC test equipment includes multiple testing units, a loading/unloading unit, and a processing unit; each testing unit is capable of testing an IC individually and has a pass rate. When the testing unit finishes a test operation, it will send test report of the IC to the processing unit. The processing unit will determine whether the IC has reached a pass threshold of the testing unit. The processing unit will issue a command, according to a predetermined rule, to transfer the IC that failed to reach the pass threshold to one of the testing units conforming to the predetermined rule to conduct a retest operation. Finally, the processing unit will confirm whether the IC that failed to reach the pass threshold has reached the pass threshold in the retest operation.

Abstract translation: 公开了一种用于系统级IC测试设备和IC测试设备的自动再测试方法，其中IC测试设备包括多个测试单元，加载/卸载单元和处理单元; 每个测试单元都能够单独测试IC并具有合格率。 当测试单元完成测试操作时，它将向处理单元发送IC的测试报告。 处理单元将确定IC是否已达到测试单元的通过阈值。 处理单元将根据预定规则发出命令，将未达到通过阈值的IC传送到符合预定规则的测试单元之一，以进行重新测试操作。 最后，处理单元将确认在重新测试操作中未达到通过阈值的IC是否达到通过阈值。