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公开(公告)号：US20020125439A1
公开(公告)日：2002-09-12
申请号：US10086759
申请日：2002-02-28
IPC分类号： G01T001/00 , G01J001/42
摘要： The invention provides a technique for correcting gamma ray intensities detected to account for variation in attenuation effects with energy. The corrected intensity values enable more accurate isotopic analysis to be conducted and render such techniques applicable to low level emission cases. The technique is particularly useful in investigate waste materials with a gamma emitting content which needs to be determined. The attenuation is corrected for using a bi- modal function to account for the attenuation effects arising from low and high atomic mass components of the material in which the emitters are present.
摘要翻译： 本发明提供一种用于校正被检测的伽马射线强度以解决能量衰减效应变化的技术。 校正的强度值使得能够进行更精确的同位素分析，并使此类技术适用于低水平排放情况。 该技术在研究需要确定的具有γ发射含量的废料方面特别有用。 校正衰减以使用双模函数来解释由发射体存在的材料的低原子质量分量和高原子质量分量引起的衰减效应。
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公开(公告)号：US20030205677A1
公开(公告)日：2003-11-06
申请号：US10454429
申请日：2003-06-04
IPC分类号： G01J001/42 , G01T001/00
摘要： The invention provides a technique for correcting gamma ray intensities detected to account for variation in attenuation effects with energy. The corrected intensity values enable more accurate isotopic analysis to be conducted and render such techniques applicable to low level emission cases. The technique is particularly useful in investigate waste materials with a gamma emitting content which needs to be determined. The attenuation is corrected for using a bi-modal function to account for the attenuation effects arising from low and high atomic mass components of the material in which the emitters are present.
摘要翻译： 本发明提供一种用于校正被检测的伽马射线强度以解决能量衰减效应变化的技术。 校正的强度值使得能够进行更精确的同位素分析，并使此类技术适用于低水平排放情况。 该技术在研究需要确定的具有γ发射含量的废料方面特别有用。 校正衰减以使用双模态函数来解释由存在发射器的材料的低原子质量分量和高原子质量分量引起的衰减效应。
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