Computing validation coverage of integrated circuit model
    1.
    发明授权
    Computing validation coverage of integrated circuit model 失效
    集成电路模型的计算验证覆盖

    公开(公告)号:US08495536B2

    公开(公告)日:2013-07-23

    申请号:US13444094

    申请日:2012-04-11

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5022

    摘要: Embodiments of the present invention provide a method of computing validation coverage of an integrated circuit model, comprising: obtaining a logical structure of a integrated circuit model under validation; searching and recording signal paths in the integrated circuit model under validation based on the logical structure; and computing coverage of validation with respect to the signal paths. According to the technical solution as provided in the embodiments of the present invention, a signal path-based validation coverage may be obtained, thereby providing data regarding validation completeness more accurately.

    摘要翻译: 本发明的实施例提供了一种计算集成电路模型的验证覆盖的方法,包括:获得验证下的集成电路模型的逻辑结构; 在逻辑结构验证的基础上,在集成电路模型中搜索和记录信号路径; 以及计算关于信号路径的验证的覆盖。 根据本发明实施例提供的技术方案,可以获得基于信号路径的验证覆盖,从而更准确地提供关于验证完整性的数据。

    COMPUTING VALIDATION COVERAGE OF INTEGRATED CIRCUIT MODEL
    2.
    发明申请
    COMPUTING VALIDATION COVERAGE OF INTEGRATED CIRCUIT MODEL 失效
    集成电路模型的计算验证覆盖

    公开(公告)号:US20130055179A1

    公开(公告)日:2013-02-28

    申请号:US13444094

    申请日:2012-04-11

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5022

    摘要: Embodiments of the present invention provide a method of computing validation coverage of an integrated circuit model, comprising: obtaining a logical structure of a integrated circuit model under validation; searching and recording signal paths in the integrated circuit model under validation based on the logical structure; and computing coverage of validation with respect to the signal paths. According to the technical solution as provided in the embodiments of the present invention, a signal path-based validation coverage may be obtained, thereby providing data regarding validation completeness more accurately.

    摘要翻译: 本发明的实施例提供了一种计算集成电路模型的验证覆盖的方法,包括:获得验证下的集成电路模型的逻辑结构; 在逻辑结构验证的基础上,在集成电路模型中搜索和记录信号路径; 以及计算关于信号路径的验证的覆盖。 根据本发明实施例提供的技术方案,可以获得基于信号路径的验证覆盖,从而更准确地提供关于验证完整性的数据。