METHOD AND APPARATUS FOR PROCESSING LOCAL HOT SPOT, ELECTRONIC DEVICE AND STORAGE MEDIUM

    公开(公告)号:US20210176653A1

    公开(公告)日:2021-06-10

    申请号:US16891061

    申请日:2020-06-03

    Inventor: Xiaolong WANG

    Abstract: A method and apparatus for processing a local hot spot, an electronic device and a storage medium. A specific implementation of the method includes: acquiring, at set times, standalone data of each node device and process data of each process within the each node device in a cloud computing environment; detecting, based on the standalone data of each node device and the process data of each process within the each node device, and pre-acquired historical fault data corresponding to each local hot spot, whether each local hot spot satisfies a preset processing condition corresponding to each local hot spot; and processing the local hot spot satisfying the processing condition, in response to detecting that a local hot spot satisfies the corresponding processing condition.

    FAULT PREDICTION METHOD, APPARATUS AND STORAGE MEDIUM

    公开(公告)号:US20210311813A1

    公开(公告)日:2021-10-07

    申请号:US17302731

    申请日:2021-05-11

    Inventor: Xiaolong WANG

    Abstract: The present application discloses a fault prediction method, apparatus, and a storage medium, and relates to fields of cloud computing and fault processing. An embodiment includes acquiring a fault alarm request, wherein the fault alarm request is obtained by at least two fault triggering parameters of a fault generated by cloud operation, a hidden danger generated by cloud operation, and a change generated by terminal operation at a user level; analyzing the fault alarm request, to obtain at least two fault triggering parameters of the fault, the hidden danger, and the change; establishing an association between the at least two fault triggering parameters of the fault, the hidden danger, and the change, to obtain an association result; and predicting a fault causing the fault alarm request according to the association result, to obtain a fault prediction result.

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