公开(公告)号：US3794426A

公开(公告)日：1974-02-26

申请号：US3794426D

申请日：1972-12-08

Applicant: BENDIX CORP

Inventor： MUELLER R ,  LOHMANN A

IPC: G02B5/32 ,  G01J3/28

CPC classification number: G02B5/32

Abstract: A spectrometer employing the principles of single point holograms, that is, Fresnel zone plate patterns (FZP), is described. The holographic recording medium and the pinhole required for making an FZP are permanently arranged on opposite sides of a transparent support medium. The interference pattern is then recorded by illuminating the recording medium with monochromatic light of a selected wavelength. Spectral analysis of light which is not monochromatic can later be made by illuminating the recorded interference pattern and by varying the optical path length between the interference pattern and a second pinhole positioned in front of a detector. Changes in the optical path between the second pinhole and the interference pattern correspond to changes in the wavelength of light which is focused on the permanently positioned pinhole. Different wavelengths can thus be detected by varying the optical path length between the second pinhole and the interference pattern and noting the intensity which passes through the fixed pinhole. The permanent mounting relationship of the illuminated pinhole and the interference pattern eliminates the usual difficulty of aligning these two components to some small fraction of a wavelength, and any aberrations produced by the structure or recording medium are cancelled during the illumination of the pattern.

Abstract translation: 描述了采用单点全息图原理的光谱仪，即菲涅耳带片图案（FZP）。 全息记录介质和制造FZP所需的针孔永久地布置在透明支撑介质的相对侧上。 然后通过用选定波长的单色光照射记录介质来记录干涉图案。 稍后可以通过照射记录的干涉图案和改变干涉图案与位于检测器前方的第二针孔之间的光程长度来进行不是单色的光的光谱分析。 第二针孔和干涉图案之间的光路的变化对应于聚焦在永久定位的针孔上的光的波长的变化。 因此可以通过改变第二针孔和干涉图案之间的光程长度并注意穿过固定针孔的强度来检测不同的波长。 照明针孔和干涉图案的永久安装关系消除了将这两个部件对准波长的一小部分的常见困难，并且在图案的照明期间由结构或记录介质产生的任何像差被消除。