Abstract:
High efficiency GaAs Schottky barrier IMPATT diodes comprising a non-uniformly doped depletion region are fabricated by instantaneously injecting a known volume of a known concentration of dopant at a known pressure during chemical vapor deposition epitaxial growth of the n layer forming the depletion region. This technique has yielded n layers 150 Angstroms thick, doped to carrier concentration values as high as 1018 cm 3, with precise control of the position of the n layer within the depletion region.