公开(公告)号：US11313935B2

公开(公告)日：2022-04-26

申请号：US16793994

申请日：2020-02-18

Applicant: Apple Inc.

Inventor： Gunes Dervisoglu ,  Christopher D. Guichet ,  Adam S. Howell ,  Alexander J. Wiens ,  Christopher E. Balcells ,  Erik L. Wang ,  Jonathan M. Beard ,  Tang Y. Tan ,  Theodore Lao ,  Tyler S. Bushnell ,  Hung A. Pham

IPC: G01R35/00 ,  G01R33/02 ,  G01R33/00

Abstract: A method for calibrating a magnetometer of an electronic device can include detecting a change in a magnetism of the electronic device, collecting a first magnetic field data from the magnetometer at sampling frequency of at least 1 hertz, generating an elliptical calibration model based at least partially on the collected first magnetic field data, collecting a second magnetic field data from the magnetometer, and fitting the collected second magnetic field data to a sphere using the elliptical calibration model.

公开(公告)号：US20210072335A1

公开(公告)日：2021-03-11

申请号：US16793994

申请日：2020-02-18

Applicant: Apple Inc.

Inventor： Gunes Dervisoglu ,  Christopher D. Guichet ,  Adam S. Howell ,  Alexander J. Wiens ,  Christopher E. Balcells ,  Erik L. Wang ,  Jonathan M. Beard ,  Tang Y. Tan ,  Theodore Lao ,  Tyler S. Bushnell ,  Hung A. Pham

IPC: G01R35/00 ,  G01R33/00 ,  G01R33/02

Abstract: A method for calibrating a magnetometer of an electronic device can include detecting a change in a magnetism of the electronic device, collecting a first magnetic field data from the magnetometer at sampling frequency of at least 1 hertz, generating an elliptical calibration model based at least partially on the collected first magnetic field data, collecting a second magnetic field data from the magnetometer, and fitting the collected second magnetic field data to a sphere using the elliptical calibration model.