公开(公告)号：US20220076599A1

公开(公告)日：2022-03-10

申请号：US17397953

申请日：2021-08-09

Applicant: Apple Inc.

Inventor： Hasan Akyol ,  Xuebei Yang ,  Chung-Lun Edwin Hsu ,  Henry C. Jen ,  John T. Wetherell

IPC: G09G3/00

Abstract: Embodiments disclosed herein provide systems and methods for testing and repairing various aspects of an electronic display. The electronic display includes a reference array and an active array. The electronic display also includes test circuitry used to test individual or any combination of pixels of the electronic display. Switches may be disposed between the pixels and the test circuitry to be to repair the various components of the electronic display.

公开(公告)号：US20220101790A1

公开(公告)日：2022-03-31

申请号：US17472322

申请日：2021-09-10

Applicant: Apple Inc.

Inventor： John T. Wetherell ,  Cheuk Chi Lo ,  Chun-Yao Huang ,  Lingtao Wang ,  Derek Keith Shaeffer ,  Henry C. Jen ,  Hasan Akyol ,  Xuebei Yang ,  Chung-Lun Edwin Hsu ,  Patrick Bryce Bennett ,  Chun-Ming Tang ,  Yingkan Lin ,  Sheng Zhang ,  Chaohao Wang ,  Runjie Xu ,  Shingo Hatanaka

IPC: G09G3/3233

Abstract: Systems and methods may reduce or eliminate image artifacts due to a defective pixel of an electronic display. An electronic display may include pixels that respectively include a self-emissive element, pixel drive circuitry that supplies a pixel drive current to drive the self-emissive element, and signal routing circuitry that reduces or eliminates a visual artifact due to a defective pixel among the pixels. The signal routing circuitry may do this by turning off the self-emissive element, supplying image data from the pixel drive circuitry to a first adjacent pixel, or receiving image data from other pixel drive circuitry from the first adjacent pixel or a second adjacent pixel.

公开(公告)号：US11783739B2

公开(公告)日：2023-10-10

申请号：US17397953

申请日：2021-08-09

Applicant: Apple Inc.

Inventor： Hasan Akyol ,  Xuebei Yang ,  Chung-Lun Edwin Hsu ,  Henry C. Jen ,  John T. Wetherell

IPC: G09G3/00

CPC classification number: G09G3/006 ,  G09G2310/0275 ,  G09G2330/12

Abstract: Embodiments disclosed herein provide systems and methods for testing and repairing various aspects of an electronic display. The electronic display includes a reference array and an active array. The electronic display also includes test circuitry used to test individual or any combination of pixels of the electronic display. Switches may be disposed between the pixels and the test circuitry to be to repair the various components of the electronic display.

公开(公告)号：US12027117B2

公开(公告)日：2024-07-02

申请号：US17472322

申请日：2021-09-10

Applicant: Apple Inc.

Inventor： John T. Wetherell ,  Cheuk Chi Lo ,  Chun-Yao Huang ,  Lingtao Wang ,  Derek Keith Shaeffer ,  Henry C. Jen ,  Hasan Akyol ,  Xuebei Yang ,  Chung-Lun Edwin Hsu ,  Patrick Bryce Bennett ,  Chun-Ming Tang ,  Yingkan Lin ,  Sheng Zhang ,  Chaohao Wang ,  Runjie Xu ,  Shingo Hatanaka

IPC: G09G3/3233

CPC classification number: G09G3/3233 ,  G09G2300/0452 ,  G09G2320/0233 ,  G09G2320/0693 ,  G09G2330/10 ,  G09G2360/145

Abstract: Systems and methods may reduce or eliminate image artifacts due to a defective pixel of an electronic display. An electronic display may include pixels that respectively include a self-emissive element, pixel drive circuitry that supplies a pixel drive current to drive the self-emissive element, and signal routing circuitry that reduces or eliminates a visual artifact due to a defective pixel among the pixels. The signal routing circuitry may do this by turning off the self-emissive element, supplying image data from the pixel drive circuitry to a first adjacent pixel, or receiving image data from other pixel drive circuitry from the first adjacent pixel or a second adjacent pixel.

公开(公告)号：US11657742B1

公开(公告)日：2023-05-23

申请号：US17399974

申请日：2021-08-11

Applicant: Apple Inc.

Inventor： Hasan Akyol ,  Chung-Lun Edwin Hsu ,  Baris Cagdaser ,  John T. Wetherell ,  Xuebei Yang ,  Ali Tabatabaei ,  Patrick Bryce Bennett ,  Yingkan Lin ,  Chun-Ming Tang ,  Xiaofeng Wang ,  Hopil Bae

IPC: G09G3/00 ,  G09G3/3258 ,  G09G3/3275

CPC classification number: G09G3/006 ,  G09G3/3258 ,  G09G3/3275 ,  G09G2320/04 ,  G09G2330/12

Abstract: Embodiments disclosed herein provide systems and methods for testing and repairing various aspects of an electronic display. The electronic display includes a reference array and an active array. The electronic display also includes test circuitry used to test individual or any combination of pixels of the electronic display. Switches may be disposed between the pixels and the test circuitry to be to repair the various components of the electronic display.