MULTI-THREAT DETECTION SYSTEM
    1.
    发明申请
    MULTI-THREAT DETECTION SYSTEM 有权
    多层次检测系统

    公开(公告)号:US20160117898A1

    公开(公告)日:2016-04-28

    申请号:US14964328

    申请日:2015-12-09

    IPC分类号: G08B13/196 G08B21/02

    摘要: The present invention is a multi-modal security checkpoint. The security checkpoint can simultaneously scan for and identify hidden metallic (weapon and shrapnel), non-metallic (explosives and IED), and radioactive/nuclear threats. The security checkpoint can also perform long range facial recognition and detect suspected terrorists. The security checkpoint combines many threat detection technologies into one checkpoint that allows it to be robust and detect a large variety of threats including hidden weapons, explosives, dirty bombs, and other threats.

    摘要翻译: 本发明是多模式安全检查点。 安全检查站可以同时扫描并识别隐藏的金属(武器和弹片),非金属(爆炸物和IED)以及放射性/核威胁。 安全检查站还可以执行长距离的面部识别并检测可疑的恐怖分子。 安全检查点将许多威胁检测技术组合成一个检查点,使其能够稳定并检测各种威胁,包括隐藏的武器,爆炸物,肮脏的炸弹和其他威胁。

    METHOD FOR STANDOFF DETECTION AND ANALYSIS OF OBJECTS

    公开(公告)号:US20170160419A1

    公开(公告)日:2017-06-08

    申请号:US14319222

    申请日:2014-06-30

    IPC分类号: G01V3/12 G01N22/00

    CPC分类号: G01V3/12

    摘要: A method for standoff detection and analysis of objects comprises sending a signal through an inspection area, from a transmitter to a receiver, wherein the signal travels through objects in its path. If the signal encounters an object, through which it must travel, the speed of signal distribution decreases and its amplitude drops. A processor then determines the amplitude of the signal and whether the amplitude is above a given threshold, and if the threshold is met, further determining the shift in length of the signal's optical path, determining the thickness of the object, calculating the dielectric permittivity constant, and comparing this constant to known values of different materials to determine a preselected group of materials, to which the object in the inspection area belongs, and whether the inspected object belongs to a preselected group of dangerous objects. A system for detecting and analyzing such materials is also disclosed.