公开(公告)号：US11016145B1

公开(公告)日：2021-05-25

申请号：US16720531

申请日：2019-12-19

Applicant: Allegro MicroSystems, LLC

Inventor： Ignacio Lesser ,  Nicolas Rigoni ,  Octavio H. Alpago ,  Lautaro Casella

IPC: G01R31/3177 ,  G01R31/317

Abstract: An integrated circuit sensor can have a test program generator that is configured to receive a portion of a scan vector, where the scan vector includes a test mode signal and a scan enable signal. The test program generator is configured to retrieve a launch-off-capture test sequence from the scan vector and use the launch-off-capture test sequence and the test mode signal to generate a launch-off-capture test signal. A test signal generator is configured to generate a launch-off-shift test signal using the launch-off-capture test signal and the scan enable signal. A built-in self-test circuit is configured to test the integrated circuit sensor using the launch-off-shift test signal.