Abstract:
A circuit with headroom monitoring includes a memory array having memory cells, a replica array, and a built-in self test circuit. The replica array has a plurality of word lines, a plurality of bit line pairs, and memory cells located at intersections of the plurality of word lines and the plurality of bit line pairs. The memory cells are of a same type as memory cells in the memory array. The built-in self test circuit is coupled to the replica array for adding a capacitance to at least one bit line of the plurality of bit line pairs, for sensing a read time of memory cells of the replica array with the capacitance so added, and for providing a headroom signal in response to the read time.
Abstract:
Some embodiments of a processing device include one or more power supply monitors to provide one or more counts representative of one or more operating frequencies of one or more circuit blocks based on a voltage supplied to the circuit block(s). Some embodiments of the processing device also include a system management unit to determine an initial voltage supplied to the circuit block(s) based on a target count and to reduce the voltage supplied to the circuit block(s) from the initial voltage in response to the count(s) generated by the power supply monitor(s) exceeding the target count.
Abstract:
A circuit with headroom monitoring includes a memory array having memory cells, a replica array, and a built-in self test circuit. The replica array has a plurality of word lines, a plurality of bit line pairs, and memory cells located at intersections of the plurality of word lines and the plurality of bit line pairs. The memory cells are of a same type as memory cells in the memory array. The built-in self test circuit is coupled to the replica array for adding a capacitance to at least one bit line of the plurality of bit line pairs, for sensing a read time of memory cells of the replica array with the capacitance so added, and for providing a headroom signal in response to the read time.
Abstract:
Some embodiments of a processing device include one or more power supply monitors to provide one or more counts representative of one or more operating frequencies of one or more circuit blocks based on a voltage supplied to the circuit block(s). Some embodiments of the processing device also include a system management unit to determine an initial voltage supplied to the circuit block(s) based on a target count and to reduce the voltage supplied to the circuit block(s) from the initial voltage in response to the count(s) generated by the power supply monitor(s) exceeding the target count.