公开(公告)号：US08732539B2

公开(公告)日：2014-05-20

申请号：US13874690

申请日：2013-05-01

申请人： AT&T Intellectual Property I, L.P.

发明人： Charles Lutz ,  Jason Speilvogel ,  Nicole Nall ,  Barron Cain ,  William Keyes ,  Gregory Irwin

IPC分类号： G01R31/28

CPC分类号： G01R31/317 ,  G01R31/2836 ,  G01R31/2894 ,  H04L1/24

摘要： A test system having a sub-system to sub-system bridge may be provided that utilizes the useful attributes of a plurality of circuit testing techniques, while reducing deficiencies associated with certain types of circuit testing. A bridged test system structure is utilized to facilitate circuit testing that is more effective and time efficient. The method analyzes performance data acquired by a first component for one or more circuits, and sends that performance data to a second test component. The second test component provides test signals to the circuits, using the performance date to enhance the use of the test signals, and also provides test response data for the circuits in response to the provided test signals.

摘要翻译： 可以提供具有子系统到子系统桥的测试系统，其利用多个电路测试技术的有用属性，同时减少与某些类型的电路测试相关的缺陷。 使用桥接测试系统结构来促进更有效和时间有效的电路测试。 该方法分析由一个或多个电路的第一组件获取的性能数据，并将该性能数据发送到第二测试组件。 第二测试部件使用性能日期来提供测试信号到电路，以增强测试信号的使用，并且还响应所提供的测试信号提供电路的测试响应数据。

公开(公告)号：US20130318415A1

公开(公告)日：2013-11-28

申请号：US13874690

申请日：2013-05-01

申请人： AT&T Intellectual Property I, L.P.

发明人： Charles Lutz ,  Jason Spielvogel ,  Nicole Hall ,  Barron Cain ,  William Keyes ,  Gregory Irwin

IPC分类号： G01R31/317

CPC分类号： G01R31/317 ,  G01R31/2836 ,  G01R31/2894 ,  H04L1/24

摘要： A test system having a sub-system to sub-system bridge may be provided that utilizes the useful attributes of a plurality of circuit testing techniques, while reducing deficiencies associated with certain types of circuit testing. A bridged test system structure is utilized to facilitate circuit testing that is more effective and time efficient. The method analyzes performance data acquired by a first component for one or more circuits, and sends that performance data to a second test component. The second test component provides test signals to the circuits, using the performance date to enhance the use of the test signals, and also provides test response data for the circuits in response to the provided test signals.

摘要翻译： 可以提供具有子系统到子系统桥的测试系统，其利用多个电路测试技术的有用属性，同时减少与某些类型的电路测试相关的缺陷。 使用桥接测试系统结构来促进更有效和时间有效的电路测试。 该方法分析由一个或多个电路的第一组件获取的性能数据，并将该性能数据发送到第二测试组件。 第二测试部件使用性能日期来提供测试信号到电路，以增强测试信号的使用，并且还响应所提供的测试信号提供电路的测试响应数据。