公开(公告)号：US20170066930A1

公开(公告)日：2017-03-09

申请号：US15256067

申请日：2016-09-02

Applicant: APPLE INC.

Inventor： MATTHEW S. ROGERS ,  SOYOUNG KIM

IPC: C09D5/16 ,  H05K5/03 ,  H04M1/02 ,  H05K5/00

CPC classification number: C09D5/1662 ,  C03C17/34 ,  C03C2217/75 ,  G06K9/00013 ,  H04M1/0202 ,  H05K5/0017 ,  H05K5/03

Abstract: An article includes an optically transparent substrate, an amorphous carbon layer formed on at least a portion of the optically transparent substrate, and an oleophobic layer attached to the optically transparent substrate by the amorphous carbon layer. The oleophobic coating, where present, may be attached to the substrate through the amorphous carbon layer. The article may be used as a cover for an electronic device.

Abstract translation: 一种物品包括光学透明基底，形成在光学透明基底的至少一部分上的无定形碳层和通过无定形碳层附着到光学透明基底上的疏油层。 存在的疏油涂层可以通过无定形碳层附着到基底上。 该物品可以用作电子设备的盖子。

公开(公告)号：US20150226723A1

公开(公告)日：2015-08-13

申请号：US14175845

申请日：2014-02-07

Applicant: APPLE INC.

Inventor： Dale N. Memering ,  MATTHEW S. ROGERS ,  SCOTT A. MYERS

IPC: G01N33/38 ,  G01N21/88 ,  G01N21/958

CPC classification number: G01N33/385 ,  G01B21/20 ,  G01N21/958

Abstract: A method of inspecting and forming sapphire structures. The method of inspecting a sapphire structure may include may include providing an annealed sapphire structure, and measuring a profile of at least a portion of the annealed sapphire structure. The profile of at least the portion of the annealed sapphire structure may be measured using a non-x-ray based measuring device. Additionally, the method of inspecting may include identifying a defect within at least a portion of the measured profile of the annealed sapphire structure.

Abstract translation: 检查和形成蓝宝石结构的方法。 检查蓝宝石结构的方法可以包括提供退火的蓝宝石结构，以及测量退火蓝宝石结构的至少一部分的轮廓。 可以使用非基于X射线的测量装置来测量退火蓝宝石结构的至少部分的轮廓。 另外，检查方法可以包括识别退火蓝宝石结构的测量轮廓的至少一部分内的缺陷。