Method And Apparatus For Monitoring The Condition Of A Power Semiconductor Module

    公开(公告)号:US20240088782A1

    公开(公告)日:2024-03-14

    申请号:US18464372

    申请日:2023-09-11

    Applicant: ABB Schweiz AG

    CPC classification number: H02M1/327 G01R31/2642 H05K7/2089

    Abstract: A field of electric drive devices and arrangements including a plurality of power semiconductor components formed in or on a common substrate, and more particularly to a method and an apparatus for monitoring the condition of a power semiconductor module. The method for monitoring the condition of a power semiconductor module of an electric drive device connected to an electric machine includes the steps of engaging a locking of the rotor of the electric machine at zero speed or at near zero speed by injecting DC currents by the electric drive device, initiating test temperature recording in the power semiconductor module, disengaging the locking the rotor of the electric machine by the electric drive device, terminating the test temperature recording and storing the recorded data of the test temperature as test temperature data, and determining the condition of the power semiconductor module utilising the test temperature data.

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