公开(公告)号：US20120273681A1

公开(公告)日：2012-11-01

申请号：US13455590

申请日：2012-04-25

Applicant: Brian Jason Schulkin ,  Thomas David Tongue ,  Justin Graf St. James

Inventor： Brian Jason Schulkin ,  Thomas David Tongue ,  Justin Graf St. James

IPC: G01J3/28

CPC classification number: G01J3/0291 ,  G01J3/0264 ,  G01J3/0272 ,  G01J3/0283 ,  G01J3/42 ,  G01N21/3563 ,  G01N21/3586 ,  G01N2201/0221

Abstract: A solution for analyzing characteristics of compounds and materials (e.g., chemical composition, specific quantity, thickness, etc.) via THz time domain spectrometry is disclosed. In one embodiment, a spectrometry system includes: a portable housing including: a portable power source; a laser source connected to the portable power source; a terahertz (THz) emitter located within the portable housing and optically connected to the laser source via an optical array including a rotary delay stage, the THz emitter configured to emit THz radiation directed to interact with a material sample; a detector optically connected to the optical array and configured to obtain waveform data from the interaction between the THz radiation and the material sample; and a computing device communicatively connected to the detector and configured to process the waveform data to determine a characteristic of the material sample.

Abstract translation: 公开了通过THz时域光谱法分析化合物和材料的特性（例如化学成分，比重量，厚度等）的方法。 在一个实施例中，分光系统包括：便携式外壳，包括：便携式电源; 连接到便携式电源的激光源; 位于便携式外壳内的太赫兹（THz）发射器，并且经由包括旋转延迟级的光学阵列光学地连接到激光源，该THz发射器被配置为发射被引导以与材料样品相互作用的THz辐射; 光学连接到所述光学阵列并被配置为从所述THz辐射与所述材料样品之间的相互作用获得波形数据的检测器; 以及计算设备，其通信地连接到所述检测器并且被配置为处理所述波形数据以确定所述材料样本的特性。