公开(公告)号：US3955086A

公开(公告)日：1976-05-04

申请号：US574875

申请日：1975-05-06

申请人： Tatsuo Tsujii ,  Fumio Nishiwaki

发明人： Tatsuo Tsujii ,  Fumio Nishiwaki

IPC分类号： G01B15/02 ,  G01N23/06 ,  G01N23/16 ,  G01N23/00

CPC分类号： G01N23/16 ,  G01B15/025

摘要： In a radiation thickness gauge of the type wherein the thickness of a sample is determined by measuring the amount of radiations transmitting through the sample, there is provided an x-ray generator for transmitting a radiation flux through a reference sheet utilized for calibration purposes and having a thickness manifesting a radiation absorption which is equivalent to that of the sample having a nominal thickness which has been compensated for the difference in the radiation absorption characteristics of the reference sheet and the sample, a radiation detector for detecting the amount of the radiations transmitting through the reference sheet and the sample, a memory for storing the output of the detector when the reference sheet is interposed, and an operator, such as a computer. The operator functions to substitute the output of the radiation detector when the sample is interposed for a term representing the variation in the thickness of an equation determined by the content of the memory and the radiation absorption function of the reference sheet so as to produce an output signal representing the thickness of the sample.

摘要翻译： 在通过测量通过样品透射的辐射量来确定样品的厚度的类型的辐射测厚仪中，提供了一种用于将辐射通量传输通过用于校准目的的参考片材的x射线发生器，并且具有 表现出辐射吸收的厚度，其等于具有已经补偿了参考片和样品的辐射吸收特性的差异的标称厚度的样品的辐射吸收，辐射检测器，用于检测透射通过的辐射量 参考片和样本，当插入参考片时存储检测器的输出的存储器和诸如计算机的操作者。 操作者的作用是在将样品插入表示由存储器的内容物和参考片材的辐射吸收函数确定的方程的厚度变化的术语时替代辐射检测器的输出，以产生输出 表示样品厚度的信号。

公开(公告)号：US4510577A

公开(公告)日：1985-04-09

申请号：US349979

申请日：1982-02-18

申请人： Tatsuo Tsujii ,  Takaaki Okino

发明人： Tatsuo Tsujii ,  Takaaki Okino

IPC分类号： G01B15/02

CPC分类号： G01B15/025

摘要： A noncontact thickness gauge system for measuring the thickness of a material is disclosed which includes a source of penetrating radiation, a radiation detector for detecting the amount of radiation received from the radiation source where the level of received radiation is a function of the radiation absorption characteristics and thickness of the material located in the radiation path, a memory for storing the output signals of the detector and curve-defining parameters for a plurality of calibration curves which correspond to respective ranges of thickness values, and a processor for processing the various signals and curve-defining parameters to determine the thickness of the material in the radiation path. The calibration curves are quadratic and are defined by at least three calibration points. Measurements using the radiation thickness gauge system are done after precalibrating the gauge system to obtain a plurality of calibration curves, storing the calibration curves in the memory, providing the signals representative of the nominal thickness and the alloy compensation coefficient for the material to be measured, selecting the calibration curve corresponding to a particular thickness range, compensating the calibration curve of the selected range for drift, inserting the material to be measured into the radiation path and then processing the output signal of the detecting means with the compensated calibration curve to determine the apparent thickness of the material.

摘要翻译： 公开了一种用于测量材料厚度的非接触式厚度计系统，其包括穿透辐射源，用于检测从辐射源接收的辐射量的辐射检测器，其中接收辐射的水平是辐射吸收特性的函数 和位于辐射路径中的材料的厚度，用于存储检测器的输出信号的存储器和对应于各个厚度值范围的多个校准曲线的曲线限定参数，以及用于处理各种信号的处理器， 曲线定义参数以确定辐射路径中的材料的厚度。 校准曲线为二次曲线，由至少三个校准点定义。 使用辐射测厚仪系统的测量是在预先校准量规系统之后进行的，以获得多个校准曲线，将校准曲线存储在存储器中，提供表示待测材料的标称厚度和合金补偿系数的信号， 选择对应于特定厚度范围的校准曲线，补偿所选择的漂移范围的校准曲线，将待测量的材料插入辐射路径中，然后用补偿的校准曲线处理检测装置的输出信号，以确定 表观材料的厚度。