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    METHODOLOGY FOR INTELLIGENT PATTERN DETECTION AND ANOMALY DETECTION IN MACHINE TO MACHINE COMMUNICATION NETWORK
    1.
    发明申请
    METHODOLOGY FOR INTELLIGENT PATTERN DETECTION AND ANOMALY DETECTION IN MACHINE TO MACHINE COMMUNICATION NETWORK 审中-公开
    机器通信网络智能模式检测和异常检测方法

    公开(公告)号：US20130346596A1

    公开(公告)日：2013-12-26

    申请号：US13533815

    申请日：2012-06-26

    Applicant: Subramanian BALAKRISHNAN ,  Narendra Kumar SHARMA

    Inventor： Subramanian BALAKRISHNAN ,  Narendra Kumar SHARMA

    IPC: G06F15/16

    CPC classification number: H04L63/1425

    Abstract: The present invention relates generally to network communications, and more particularly to machine-to-machine (M2M) data communications. The present invention provides for a method, apparatus and computer program product for detecting performance event data across a machine-to-machine (M2M) network indicative of anomalous performance of data and thereafter alerting users of performance issues in real-time or near real-time.

    Abstract translation: 本发明一般涉及网络通信，更具体地涉及机对机（M2M）数据通信。 本发明提供了一种用于在机器对机器（M2M）网络之间检测表示数据异常性能的性能事件数据的方法，装置和计算机程序产品，并且随后向用户提供实时或接近实时的性能问题， 时间。

    System and method for managing transaction data in a mobile communication network using selective sampling
    5.
    发明授权
    System and method for managing transaction data in a mobile communication network using selective sampling 有权
    使用选择性抽样来管理移动通信网络中的交易数据的系统和方法

    公开(公告)号：US08717917B1

    公开(公告)日：2014-05-06

    申请号：US13095826

    申请日：2011-04-27

    Applicant: Subramanian Balakrishnan ,  Strafford Wentworth

    Inventor： Subramanian Balakrishnan ,  Strafford Wentworth

    IPC: H04L12/26

    CPC classification number: H04L43/04 ,  H04L43/022

    Abstract: A system and method for managing transactional data in a mobile communication network utilizes selectively sampling of a portion of data of transactions to and from mobile communication devices of the mobile communication network. An extract, transform and load process is then performed one the sampled data of the transactions and the resulting data is stored in a warehouse database, which can be used for analytics reporting.

    Abstract translation: 用于管理移动通信网络中的交易数据的系统和方法利用对移动通信网络的移动通信设备的交易数据的一部分的选择性采样。 然后，执行提取，转换和加载过程一个事务的采样数据，并将生成的数据存储在可用于分析报告的仓库数据库中。

    Computer-implemented methods, carrier media, and systems for determining sizes of defects detected on a wafer
    6.
    发明授权
    Computer-implemented methods, carrier media, and systems for determining sizes of defects detected on a wafer 有权
    计算机实现的方法，载体介质和用于确定在晶片上检测到的缺陷尺寸的系统

    公开(公告)号：US08000905B1

    公开(公告)日：2011-08-16

    申请号：US11855589

    申请日：2007-09-14

    Applicant: Stephanie Chen ,  Subramanian Balakrishnan ,  Richard Wallingford

    Inventor： Stephanie Chen ,  Subramanian Balakrishnan ,  Richard Wallingford

    IPC: G01B5/28

    CPC classification number: G01N21/8851 ,  G01N21/9501 ,  G01N21/956 ,  G01N2021/8854

    Abstract: Computer-implemented methods, carrier media, and systems for determining sizes of defects detected on a wafer are provided. One computer-implemented method includes separating the defects into groups based on output acquired for the defects by multiple channels of an inspection system used to detect the defects on the wafer. The method also includes separating the defects in one or more of the groups into subgroups based on the output acquired for the defects by one or more of the multiple channels. In addition, the method includes determining the sizes of one or more of the defects in one or more of the subgroups separately based on the output acquired for the defects by only one of the multiple channels and a calibration parameter. The calibration parameter is different for each of the subgroups and is acquired by using another system to measure actual sizes of defects detected on other wafers.

    Abstract translation: 提供了计算机实现的方法，载体介质和用于确定晶片上检测到的缺陷尺寸的系统。 一种计算机实现的方法包括基于用于检测晶片上的缺陷的检查系统的多个通道为缺陷获取的输出将缺陷分离成组。 该方法还包括基于通过一个或多个多个通道为缺陷获得的输出将一个或多个组中的缺陷分离成子组。 此外，该方法包括基于仅通过多个通道中的一个获得的用于缺陷的输出和校准参数，分别确定一个或多个子组中的一个或多个子组中的一个或多个缺陷的大小。 校准参数对于每个子组是不同的，并且通过使用另一个系统来测量在其他晶片上检测到的缺陷的实际尺寸来获取。

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