公开(公告)号：US09600795B2

公开(公告)日：2017-03-21

申请号：US13442462

申请日：2012-04-09

Applicant: Steve Demuth ,  Aliza R. Heching ,  Jimeng Sun ,  Judah M. Diament

Inventor： Steve Demuth ,  Aliza R. Heching ,  Jimeng Sun ,  Judah M. Diament

IPC: G06Q10/06 ,  G06N5/04 ,  G06N5/00 ,  G06F17/30

CPC classification number: G06Q10/067 ,  G06F17/30864 ,  G06N5/00 ,  G06N5/04 ,  G06Q10/06

Abstract: Common sub-process patterns in a plurality of deployed process models may be discovered, and performance measures associated with the sub-process patterns may be computed based on runtime events of the deployed process models. Positive or negative performance patterns among sub-process patterns may be identified and used for creating new process models or improving existing process models.

公开(公告)号：US20130268251A1

公开(公告)日：2013-10-10

申请号：US13442462

申请日：2012-04-09

Applicant: Steve Demuth ,  Aliza R. Heching ,  Jimeng Sun ,  Judah M. Diament

Inventor： Steve Demuth ,  Aliza R. Heching ,  Jimeng Sun ,  Judah M. Diament

IPC: G06G7/48

CPC classification number: G06Q10/067 ,  G06F17/30864 ,  G06N5/00 ,  G06N5/04 ,  G06Q10/06

Abstract: Common sub-process patterns in a plurality of deployed process models may be discovered, and performance measures associated with the sub-process patterns may be computed based on runtime events of the deployed process models. Positive or negative performance patterns among sub-process patterns may be identified and used for creating new process models or improving existing process models.

Abstract translation: 可以发现多个部署的过程模型中的公共子过程模式，并且可以基于所部署的过程模型的运行时事件来计算与子过程模式相关联的性能测量。 可以识别子过程模式中的正或负性能模式，并用于创建新的过程模型或改进现有过程模型。