Optical measuring instrument using both reflectometry and white-light interferometry
    1.
    发明授权
    Optical measuring instrument using both reflectometry and white-light interferometry 有权
    光学测量仪器使用反射测量和白光干涉测量

    公开(公告)号:US08416399B2

    公开(公告)日:2013-04-09

    申请号:US12631419

    申请日:2009-12-04

    IPC分类号: G01N21/00 G01B11/02 G01B11/28

    摘要: A method for determining the surface topography of a coated object and for the simultaneous spatially resolved determination of the thickness of the layer on the coated object. It is provided that the surface topography is measured with the aid of white-light interferometry, the thickness of the layer is measured by the principle of reflectometry, and by using, for both measurements, a shared radiation source having an electromagnetic radiation spectrum, which is reflected from the layer surface in a first wavelength range contained in the radiation spectrum and which penetrates into the layer in a second wavelength range contained in the radiation spectrum. Also described is a corresponding optical measuring instrument. The method and the optical measuring instrument make simultaneous highly accurate surface measurement of the surface topography and of the layer thickness of coated objects possible.

    摘要翻译: 一种用于确定涂覆物体的表面形貌的方法,以及用于同时空间解析确定涂覆物体上的层的厚度的方法。 提供的是通过白光干涉测量来测量表面形貌,层的厚度是通过反射测量原理测量的,并且通过对两个测量使用具有电磁辐射光谱的共享辐射源,其中 在包含在辐射光谱中的第一波长范围内的层表面反射,并且穿透辐射光谱中包含的第二波长范围内的层。 还描述了相应的光学测量仪器。 该方法和光学测量仪器可以对表面形貌和涂层物体的层厚度进行同时高精度的表面测量。

    OPTICAL MEASURING DEVICE
    2.
    发明申请
    OPTICAL MEASURING DEVICE 有权
    光学测量装置

    公开(公告)号:US20100183188A1

    公开(公告)日:2010-07-22

    申请号:US12631419

    申请日:2009-12-04

    摘要: A method for determining the surface topography of a coated object and for the simultaneous spatially resolved determination of the thickness of the layer on the coated object. It is provided that the surface topography is measured with the aid of white-light interferometry, the thickness of the layer is measured by the principle of reflectometry, and by using, for both measurements, a shared radiation source having an electromagnetic radiation spectrum, which is reflected from the layer surface in a first wavelength range contained in the radiation spectrum and which penetrates into the layer in a second wavelength range contained in the radiation spectrum. Also described is a corresponding optical measuring instrument. The method and the optical measuring instrument make simultaneous highly accurate surface measurement of the surface topography and of the layer thickness of coated objects possible.

    摘要翻译: 一种用于确定涂覆物体的表面形貌的方法,以及用于同时空间解析确定涂覆物体上的层的厚度的方法。 提供的是通过白光干涉测量来测量表面形貌,层的厚度是通过反射测量原理测量的,并且通过对两个测量使用具有电磁辐射光谱的共享辐射源,其中 在包含在辐射光谱中的第一波长范围内的层表面反射,并且穿透辐射光谱中包含的第二波长范围内的层。 还描述了相应的光学测量仪器。 该方法和光学测量仪器可以对表面形貌和涂层物体的层厚度进行同时高精度的表面测量。

    METHOD FOR PRODUCING AN OBJECT INCLUDING AT LEAST ONE AUTONOMOUS MOVING PART AND ONE FIXING PART
    3.
    发明申请
    METHOD FOR PRODUCING AN OBJECT INCLUDING AT LEAST ONE AUTONOMOUS MOVING PART AND ONE FIXING PART 审中-公开
    生产对象的方法,包括至少一个自动移动部件和一个固定部件

    公开(公告)号:US20090039547A1

    公开(公告)日:2009-02-12

    申请号:US12066977

    申请日:2006-08-25

    IPC分类号: B29C45/14

    摘要: A method for producing an object including at least one autonomous part movably disposed relative to an affixing part includes: providing a mold having at least one cavity configured to produce the at least one autonomous part; filling the at least one cavity with a curable or solidifying molding compound that includes a pulverulent sintering material and a binder; allowing the molding compound to solidify so as to form the at least one autonomous part; removing the at least one autonomous part from the cavity; disposing the at least one autonomous part in or on the affixing part so as to form a preform; and heat treating the preform so as to form the object.

    摘要翻译: 一种用于生产包括相对于固定部件可移动地设置的至少一个自主部件的物体的方法,包括:提供具有至少一个空腔的模具,其被配置为产生所述至少一个自主部件; 用包含粉状烧结材料和粘合剂的可固化或固化的模塑料填充至少一个空腔; 允许模塑料固化以形成至少一个自主部分; 从所述腔中移除所述至少一个自主部分; 将所述至少一个自主部件设置在所述固定部件中或所述固定部件上以便形成预成型件; 并对预成型件进行热处理以形成该物体。