公开(公告)号：US10217205B2

公开(公告)日：2019-02-26

申请号：US15065901

申请日：2016-03-10

申请人： Min Chul Park ,  Dae Sin Kim ,  Sat Byul Kim ,  Sae Jin Kim ,  Zhiliang Xia ,  Je Hyun Lee

发明人： Min Chul Park ,  Dae Sin Kim ,  Sat Byul Kim ,  Sae Jin Kim ,  Zhiliang Xia ,  Je Hyun Lee

IPC分类号： G06K9/00 ,  G06T7/00

摘要： Provided are a method and system for analyzing grains using a high-resolution transmission electron microscopy (HRTEM) image. The method relates to analyzing nanometer grains, and includes receiving an HRTEM image, setting local windows each having a predetermined size for the HRTEM image, performing at least one Fast Fourier transformation on pixel data determined by the local windows to calculate local transformation data; and analyzing grains based on the local transformation data.

公开(公告)号：US20160267643A1

公开(公告)日：2016-09-15

申请号：US15065901

申请日：2016-03-10

申请人： MIN CHUL PARK ,  DAE SIN KIM ,  SAT BYUL KIM ,  SAE JIN KIM ,  ZHILIANG XIA ,  JE HYUN LEE

发明人： MIN CHUL PARK ,  DAE SIN KIM ,  SAT BYUL KIM ,  SAE JIN KIM ,  ZHILIANG XIA ,  JE HYUN LEE

IPC分类号： G06T7/00 ,  G06K9/00

CPC分类号： G06T7/0004 ,  G06K9/00127 ,  G06K9/0014 ,  G06T2207/20056 ,  G06T2207/30148

摘要： Provided are a method and system for analyzing grains using a high-resolution transmission electron microscopy (HRTEM) image. The method relates to analyzing nanometer grains, and includes receiving an HRTEM image, setting local windows each having a predetermined size for the HRTEM image, performing at least one Fast Fourier transformation on pixel data determined by the local windows to calculate local transformation data; and analyzing grains based on the local transformation data.

摘要翻译： 提供了使用高分辨率透射电子显微镜（HRTEM）图像分析晶粒的方法和系统。 该方法涉及分析纳米颗粒，并且包括接收HRTEM图像，设置每个对于HRTEM图像具有预定尺寸的局部窗口，对由本地窗口确定的像素数据执行至少一个快速傅立叶变换以计算局部变换数据; 并根据局部变换数据分析晶粒。