CONTAMINATION-INSPECTING APPARATUS AND DETECTION CIRCUIT
    3.
    发明申请
    CONTAMINATION-INSPECTING APPARATUS AND DETECTION CIRCUIT 有权
    污染检查装置和检测电路

    公开(公告)号:US20080278717A1

    公开(公告)日:2008-11-13

    申请号:US12116241

    申请日:2008-05-07

    IPC分类号: G01N21/88

    摘要: The detection part has: a subtraction module for calculating correction data from data of detection systems when a reference-voltage generation module applies a reference voltage to the detection systems; a data-holding module for holding the correction data; an addition module for making a correction of detection data; a comparison module for comparing the detection data with switching data; and a selector for switching data of the detection systems including data subjected to the correction according to the output of the comparison module.

    摘要翻译: 检测部具有:减法模块,用于当参考电压产生模块向检测系统施加参考电压时,从检测系统的数据计算校正数据; 用于保持校正数据的数据保持模块; 用于对检测数据进行校正的加法模块; 比较模块,用于将检测数据与切换数据进行比较; 以及选择器,用于根据比较模块的输出来切换包括经过校正的数据的检测系统的数据。

    Contamination-inspecting apparatus and detection circuit
    4.
    发明授权
    Contamination-inspecting apparatus and detection circuit 有权
    污染检查装置和检测电路

    公开(公告)号:US08035071B2

    公开(公告)日:2011-10-11

    申请号:US12116241

    申请日:2008-05-07

    IPC分类号: G01N21/88

    摘要: The detection part has: a subtraction module for calculating correction data from data of detection systems when a reference-voltage generation module applies a reference voltage to the detection systems; a data-holding module for holding the correction data; an addition module for making a correction of detection data; a comparison module for comparing the detection data with switching data; and a selector for switching data of the detection systems including data subjected to the correction according to the output of the comparison module.

    摘要翻译: 检测部具有:减法模块,用于当参考电压产生模块向检测系统施加参考电压时,从检测系统的数据计算校正数据; 用于保持校正数据的数据保持模块; 用于对检测数据进行校正的加法模块; 比较模块,用于将检测数据与切换数据进行比较; 以及选择器,用于根据比较模块的输出来切换包括经过校正的数据的检测系统的数据。

    Pulse generation circuit and semiconductor tester that uses the pulse generation circuit
    5.
    发明授权
    Pulse generation circuit and semiconductor tester that uses the pulse generation circuit 有权
    脉冲发生电路和采用脉冲发生电路的半导体测试仪

    公开(公告)号:US07085982B2

    公开(公告)日:2006-08-01

    申请号:US10345230

    申请日:2003-01-16

    IPC分类号: G06F11/00 G01R31/28

    CPC分类号: G01R31/31922 H03K5/135

    摘要: A pulse generation circuit including a pulse formation circuit for generating normal and dummy pulses according to second delay value data, a data calculation circuit for calculating first delay value data at a timing at which the pulses are generated from the pulse formation circuit according to pattern data having information for determining whether to generate pulses from the pulse formation circuit, a dummy pulse control circuit for controlling generation of a dummy pulse in a no-pulse-generation cycle from the pulse formation circuit according to the second delay value data obtained by detecting the no-pulse-generation cycle from the first delay value data, and a logical gate circuit for eliminating the dummy pulses generated from the pulse formation circuit.

    摘要翻译: 一种脉冲发生电路,包括根据第二延迟值数据产生正常和虚拟脉冲的脉冲形成电路,数据计算电路,用于根据图形数据从脉冲形成电路产生脉冲的定时计算第一延迟值数据 具有用于确定是否从脉冲形成电路产生脉冲的信息;虚拟脉冲控制电路,用于根据通过检测所述脉冲发生电路获得的第二延迟值数据从脉冲形成电路控制无脉冲生成周期中的伪脉冲的产生 来自第一延迟值数据的无脉冲生成周期,以及用于消除从脉冲形成电路产生的伪脉冲的逻辑门电路。