Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same
    1.
    发明授权
    Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same 有权
    弹性电插入件,包括插入件的系统,以及使用和形成插入件的方法

    公开(公告)号:US08970240B2

    公开(公告)日:2015-03-03

    申请号:US13287794

    申请日:2011-11-02

    Abstract: Resilient electrical interposers that may be utilized to form a plurality of electrical connections between a first device and a second device, as well as systems that may utilize the resilient electrical interposers and methods of use and/or fabrication thereof. The resilient electrical interposers may include a resilient dielectric body with a plurality of electrical conduits contained therein. The plurality of electrical conduits may be configured to provide a plurality of electrical connections between a first surface of the electrical interposer and/or the resilient dielectric body and a second, opposed, surface of the electrical interposer and/or the resilient dielectric body. The systems and methods disclosed herein may provide for improved vertical compliance, improved contact force control, and/or improved dimensional stability of the resilient electrical interposers.

    Abstract translation: 可用于在第一装置和第二装置之间形成多个电连接的弹性电插入件,以及可利用弹性电插入件及其使用和/或制造方法的系统。 弹性电插入件可以包括弹性介电体,其中包含多个电导管。 多个电导管可以被配置为在电插入器的第一表面和/或弹性介电体之间提供多个电连接,以及电插入器和/或弹性介电体的第二相对的表面。 本文公开的系统和方法可以提供弹性电插入器的改进的垂直顺应性,改进的接触力控制和/或改进的尺寸稳定性。

    SYSTEMS, DEVICES, AND METHODS FOR TWO-SIDED TESTING OF ELECTRONIC DEVICES
    2.
    发明申请
    SYSTEMS, DEVICES, AND METHODS FOR TWO-SIDED TESTING OF ELECTRONIC DEVICES 审中-公开
    用于电子设备的两面测试的系统,设备和方法

    公开(公告)号:US20130015871A1

    公开(公告)日:2013-01-17

    申请号:US13542337

    申请日:2012-07-05

    CPC classification number: G01R31/2884 G01R31/2887

    Abstract: Systems, devices, and methods for two-sided testing of electronic devices. These systems, devices, and methods may include the use of a test fixture that is configured to electrically connect a back side electrical pad of a device under test with an auxiliary pad that faces in a different direction than the back side electrical pad. Additionally or alternatively, these systems, devices, and methods also may include the use of a probe head that is configured to form an electrical connection with both the auxiliary pad and a front side electrical pad of the device under test. The systems, devices, and methods also may include providing a test signal to the device under test, receiving a resultant signal from the device under test, and/or analyzing the resultant signal.

    Abstract translation: 用于电子设备双面测试的系统,设备和方法。 这些系统,装置和方法可以包括使用测试夹具,其被配置为将被测器件的背面电焊盘与面向不同于背面电焊盘的方向的辅助焊盘电连接。 附加地或替代地,这些系统,装置和方法还可以包括使用探针头,其被配置成与被测设备的辅助焊盘和前侧电焊盘形成电连接。 系统,设备和方法还可以包括向被测设备提供测试信号,从被测设备接收结果信号和/或分析所得到的信号。

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