公开(公告)号：US20130316365A1

公开(公告)日：2013-11-28

申请号：US13825298

申请日：2011-09-21

Applicant: Elly van Donselaar ,  Matthia Karreman ,  Hans Gerritsen ,  Theo Verrips ,  Uwe Luecken

Inventor： Elly van Donselaar ,  Matthia Karreman ,  Hans Gerritsen ,  Theo Verrips ,  Uwe Luecken

IPC: G01N1/30

CPC classification number: G01N1/30 ,  G01N1/06 ,  G01N1/42

Abstract: The invention relates to a method of forming sections for inspection in an electron microscope and a fluorescent light microscope. Conventionally these sections are made by for example the Tokuyama method, which involves freeze substitution and fixing at cryogenic temperatures. A problem is the time that it takes to come from a sample to sections, as the diffusion speed of the chemicals (organic solvents and fixatives) is extremely low. The invention comprises the sectioning of the sample at cryogenic temperature and fixing afterwards. As the sections are much thinner (e.g. 100 nm or less) than the sample (often >1 μm), the total time it takes to come from a sample to a section ready for inspection is less than 8 hours. This makes it possible to achieve results relevant for health care within one workday.

Abstract translation: 本发明涉及一种在电子显微镜和荧光显微镜中形成检查部分的方法。 通常这些部分是通过例如Tokuyama方法制成的，其涉及在低温下的冷冻置换和固定。 问题是从样品到样品的时间，化学品（有机溶剂和固定剂）的扩散速度极低。 本发明包括样品在低温下的切片和固定。 由于切片比样品（通常> 1um）更薄（例如100nm或更小），从样品到准备检查的部分所花费的总时间小于8小时。 这样可以在一个工作日内实现与医疗保健有关的结果。