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1.发明授权Device for the recognition of caries, plaque or bacterial infection on teeth 失效用于识别牙齿上的龋齿，斑块或细菌感染的装置
公开(公告)号：US06024562A
公开(公告)日：2000-02-15
申请号：US744019
申请日：1996-11-05
申请人： Raimund Hibst , Robert Gall , Mario Klafke
发明人： Raimund Hibst , Robert Gall , Mario Klafke
CPC分类号： G01N21/6486 , A61B5/0088 , A61C19/04 , G01N2021/6484
摘要： A device for the recognition of caries, plaque or bacterial infection on teeth, which includes a light source for generating an excitation radiation which is to be directed onto a tooth to be investigated and producing an fluorescence radiation at the tooth. Also included is a detection device for detecting the fluorescence radiation of the tooth, and a spectral filter arranged in front of the detection device, wherein the wavelength of the excitation radiation emitted from the light source lies within the range of between 640 and 670 nm.
摘要翻译： 用于识别牙齿上的龋齿，斑块或细菌感染的装置，其包括用于产生要被引导到待研究的牙齿上并在牙齿处产生荧光辐射的激发辐射的光源。 还包括用于检测牙齿的荧光辐射的检测装置和布置在检测装置前面的光谱滤波器，其中从光源发射的激发辐射的波长在640和670nm之间的范围内。
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2.发明授权Method for determining deviations between coordinate systems of different technical systems 有权确定不同技术系统的坐标系之间偏差的方法公开(公告)号：US09173560B2
公开(公告)日：2015-11-03
申请号：US13577385
申请日：2010-02-15
CPC分类号： A61B3/113 , A61F9/00802 , A61F2009/00846 , A61F2009/00872
摘要： Method for determining deviations between coordinate systems of different technical systems, comprising the steps of determining a coordinate position of a reference feature of a test object in the coordinate system (u,v) of a first of the technical systems, the attachment of at least one test feature to the test object, with the test feature being attached in the coordinate system of a second of the technical systems at a coordinate position that is determined in dependence on the determined coordinate position of the reference feature, the determination of a coordinate position of at least one test feature and/or at least one feature derived from it in the coordinate system (u,v) of the first technical system, and determination of deviations between the coordinate systems of the first and second technical system, at least on the basis of: (a) the determined coordinate position of at least one test feature and/or of at least one feature derived from it in the coordinate system (u,v) of the first technical system and (b) the coordinate position of the reference feature in the coordinate system (u,v) of the first technical system.
摘要翻译： 用于确定不同技术系统的坐标系之间的偏差的方法，包括以下步骤：确定第一技术系统的坐标系（u，v）中的测试对象的参考特征的坐标位置，至少附接 测试对象的一个测试特征，其中测试特征被附加在技术系统中的第二技术系统的坐标系中的坐标位置处，该坐标位置根据所确定的参考特征的坐标位置确定，坐标位置的确定 至少一个测试特征和/或在第一技术系统的坐标系（u，v）中从其获得的至少一个特征，以及确定第一和第二技术系统的坐标系之间的偏差，至少在 以下基础：（a）在坐标系（u，v）中确定至少一个测试特征和/或从其导出的至少一个特征的确定的坐标位置 f第一技术系统和（b）参考特征在第一技术系统的坐标系（u，v）中的坐标位置。
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3.发明申请METHOD FOR DETERMINING DEVIATIONS BETWEEN COORDINATE SYSTEMS OF DIFFERENT TECHNICAL SYSTEMS 有权用于确定不同技术系统协调系统之间的偏差的方法公开(公告)号：US20120307207A1
公开(公告)日：2012-12-06
申请号：US13577385
申请日：2010-02-15
CPC分类号： A61B3/113 , A61F9/00802 , A61F2009/00846 , A61F2009/00872
摘要： Method for determining deviations between coordinate systems of different technical systems, comprising the steps of determining a coordinate position of a reference feature of a test object in the coordinate system (u,v) of a first of the technical systems, the attachment of at least one test feature to the test object, with the test feature being attached in the coordinate system of a second of the technical systems at a coordinate position that is determined in dependence on the determined coordinate position of the reference feature, the determination of a coordinate position of at least one test feature and/or at least one feature derived from it in the coordinate system (u,v) of the first technical system, and determination of deviations between the coordinate systems of the first and second technical system, at least on the basis of: (a) the determined coordinate position of at least one test feature and/or of at least one feature derived from it in the coordinate system (u,v) of the first technical system and (b) the coordinate position of the reference feature in the coordinate system (u,v) of the first technical system.
摘要翻译： 用于确定不同技术系统的坐标系之间的偏差的方法，包括以下步骤：确定第一技术系统的坐标系（u，v）中的测试对象的参考特征的坐标位置，至少附接 测试对象的一个测试特征，其中测试特征被附加在技术系统中的第二技术系统的坐标系中的坐标位置处，该坐标位置根据所确定的参考特征的坐标位置确定，坐标位置的确定 至少一个测试特征和/或在第一技术系统的坐标系（u，v）中从其获得的至少一个特征，以及确定第一和第二技术系统的坐标系之间的偏差，至少在 以下基础：（a）在坐标系（u，v）中确定至少一个测试特征和/或从其导出的至少一个特征的确定的坐标位置 f第一技术系统和（b）参考特征在第一技术系统的坐标系（u，v）中的坐标位置。
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