公开(公告)号：US20150155421A1

公开(公告)日：2015-06-04

申请号：US14408368

申请日：2012-06-21

申请人： Dominique Biava ,  Mathieu Rault ,  Jean-Marc Inglese ,  Sylvie Bothorel ,  Didier Gourier ,  Laurent Binet ,  Philippe Barboux ,  Jean-Pierre Ponpon

发明人： Dominique Biava ,  Mathieu Rault ,  Jean-Marc Inglese ,  Sylvie Bothorel ,  Didier Gourier ,  Laurent Binet ,  Philippe Barboux ,  Jean-Pierre Ponpon

IPC分类号： H01L31/18 ,  H01L31/08 ,  A61B6/14 ,  H01L31/0368

CPC分类号： H01L31/18 ,  A61B6/14 ,  A61B6/145 ,  C04B35/01 ,  C04B35/5152 ,  C04B35/645 ,  C04B2235/3296 ,  C04B2235/444 ,  G01T1/24 ,  H01L31/02966 ,  H01L31/032 ,  H01L31/0368 ,  H01L31/085

摘要： This invention relates to a method to manufacture a chip to detect the direct conversion of X-rays. It also relates to a direct conversion detector for X-rays using such a chip and dental radiology equipment using at least one such detector.The method to manufacture the wafer comprises a step for applying pressure (3, 4, 4a) to a powdered polycrystalline semiconductor material and a step for heating (5-9) during a set time period. It comprises a preliminary step for providing an impurity level of at least 0.2% in the polycrystalline semiconductor material.

摘要翻译： 本发明涉及一种制造芯片以检测X射线直接转换的方法。 它还涉及使用这种使用至少一个这种检测器的芯片和牙科放射学设备进行X射线的直接转换检测器。 制造晶片的方法包括在设定的时间段内对粉末状多晶半导体材料施加压力（3,4,4a）和加热步骤（5-9）的步骤。 它包括在多晶半导体材料中提供至少0.2％的杂质水平的预备步骤。

公开(公告)号：US09037316B2

公开(公告)日：2015-05-19

申请号：US13809628

申请日：2011-07-13

申请人： Max Abildgaard ,  Laurent Binet

发明人： Max Abildgaard ,  Laurent Binet

IPC分类号： G06F17/00 ,  B64C27/00

CPC分类号： G06F17/00 ,  B64C27/006

摘要： A method for early detection of the vortex ring state in a helicopter includes steps of establishing flight control signals for flight control with regard to the vertical movement axis of the helicopter, detecting resultant movements in the vertical movement axis of the helicopter, and detecting an impending vortex ring state of the helicopter in accordance with a correlation between the flight control signals and the vertical movements in the vertical movement axis.

摘要翻译： 一种用于在直升机中早期检测涡环状态的方法包括建立关于直升机的垂直运动轴的飞行控制信号的飞行控制信号的步骤，检测直升机的垂直运动轴中的合成运动，以及检测即将到来的 根据飞行控制信号与垂直运动轴上的垂直运动之间的相关性，直升机的涡环状态。

公开(公告)号：US10937921B2

公开(公告)日：2021-03-02

申请号：US14408368

申请日：2012-06-21

申请人： Dominique Biava ,  Mathieu Rault ,  Jean-Marc Inglese ,  Sylvie Bothorel ,  Didier Gourier ,  Laurent Binet ,  Philippe Barboux ,  Jean-Pierre Ponpon

发明人： Dominique Biava ,  Mathieu Rault ,  Jean-Marc Inglese ,  Sylvie Bothorel ,  Didier Gourier ,  Laurent Binet ,  Philippe Barboux ,  Jean-Pierre Ponpon

IPC分类号： H01L31/18 ,  H01L31/08 ,  A61B6/14 ,  H01L31/0368

摘要： This invention relates to a method to manufacture a chip to detect the direct conversion of X-rays. It also relates to a direct conversion detector for X-rays using such a chip and dental radiology equipment using at least one such detector. The method to manufacture the wafer comprises a step for applying pressure (3, 4, 4 a) to a powdered polycrystalline semiconductor material and a step for heating (5-9) during a set time period. It comprises a preliminary step for providing an impurity level of at least 0.2% in the polycrystalline semiconductor material.

公开(公告)号：US20130173091A1

公开(公告)日：2013-07-04

申请号：US13809628

申请日：2011-07-13

申请人： Max Abildgaard ,  Laurent Binet

发明人： Max Abildgaard ,  Laurent Binet

IPC分类号： G06F17/00

CPC分类号： G06F17/00 ,  B64C27/006

摘要： The invention relates to a method for early detection of the vortex ring state in a helicopter, having the following steps: establishing flight control signals for flight control with regard to the vertical movement axis of the helicopter and detecting resultant movements in the vertical movement axis of the helicopter, and detecting early the vortex ring state of the helicopter in accordance with a correlation between the flight control signals and the vertical movements in the vertical movement axis.

摘要翻译： 本发明涉及一种用于在直升机中早期检测涡环状态的方法，具有以下步骤：建立关于直升机的垂直运动轴的飞行控制的飞行控制信号，并检测直升机的垂直运动轴的合成运动 直升机，并且根据飞行控制信号与垂直运动轴线的垂直运动之间的相关性早期检测直升机的涡环状态。