公开(公告)号：US6167113A

公开(公告)日：2000-12-26

申请号：US310278

申请日：1999-05-12

申请人： Charles J. Armentrout ,  Thomas Basinger ,  James H. Beyer ,  Brian D. Colesa ,  Paul Olsztyn ,  Karen G. Smith ,  Carl Strandberg ,  David Sullivan

发明人： Charles J. Armentrout ,  Thomas Basinger ,  James H. Beyer ,  Brian D. Colesa ,  Paul Olsztyn ,  Karen G. Smith ,  Carl Strandberg ,  David Sullivan

IPC分类号： G01B15/02 ,  G01N23/223

CPC分类号： G01N23/223 ,  G01B15/025 ,  G01N2223/076

摘要： An apparatus and method are disclosed for measuring the area density of a low density material sample. The system includes an x-ray emitter which emits x-rays in the range of 3 kilovolts to 20 kilovolts and the x-rays pass through the sample. An imaging device converts the x-rays which pass through the sample to visible light to produce a visible image corresponding to the sample and in which the visible image has an intensity which varies as a function of the area density across the sample. A camera produces an output signal representative of the intensity of the visible image across the sample while a computer processor processes the signal from the camera after digitization to produce an analysis of the area density of the sample.

摘要翻译： 公开了用于测量低密度材料样品的面积密度的装置和方法。 该系统包括发射在3千伏至20千伏范围内的x射线并且x射线穿过样品的x射线发射器。 成像装置将通过样品的x射线转换成可见光，以产生对应于样品的可见光图像，其中可见光图像的强度随样品的面积密度而变化。 相机产生表示样品的可见图像的强度的输出信号，而计算机处理器在数字化之后处理来自相机的信号，以产生样品的面积密度的分析。