摘要:
An error code pattern generation circuit includes a first storage unit configured to store at least one bit of an error code, and output error data for a first time period; and a second storage unit configured to store at least one remaining bit of the error code and output the error data for a second time period which is different from the first time period.
摘要:
A nonvolatile memory device includes a 3D memory cell array having words lines that extend from a lowest memory cell array layer closest to a substrate to a highest memory cell array layer farthest from the substrate, a voltage generator circuit generating first and second voltage signals, and a row selecting circuit that simultaneously applies the first voltage signal to a selected word line and the second voltage signal to an unselected word line. The selected word line and the unselected word line have different resistances, yet the first voltage signal is applied to the selected word line and the second voltage signal is applied to the unselected word line with a same rising slope over a defined period of time.
摘要:
A semiconductor device includes: a clock input unit configured to receive a system clock and a data clock externally; a phase dividing unit configured to generate a plurality of multi-system clocks in response to the system clock, wherein each of the multi-system clocks has an individual phase difference; a phase detecting unit configured to detect phase differences between the plurality of multi-system clock and the data clock and to generating generate a training information signal in response to the detection result; and a signal transmitting unit configured to transmit the training information signal.
摘要:
A semiconductor memory device includes a first data input/output unit configured to receive a normal training data, whose data window is scanned based on an edge of a source clock, in response to a training input command, and output a data in a state where an edge of the data window is synchronized with the edge of the source clock in response to a training output command, and a second data input/output unit configured to receive a recovery information training data, whose data window is scanned based on the edge of the source clock, in response to the training input command, and output a data in a state where an edge of a data window is synchronized with the edge of the source clock in response to the training output command.
摘要:
A semiconductor memory device includes a system clock input block configured to be inputted with a system clock, a data clock input block configured to be inputted with a data clock, a first phase detection block configured to compare a phase of the system clock, generate a first phase detection signal, and determine a logic level of a reverse control signal in response to the first phase detection signal, a second phase detection block configured to compare a phase of a clock acquired by delaying the system clock by a correction time, generate a second phase detection signal, and determine a logic level of a clock select signal in response to the first and second phase detection signals, and a clock select block configured to select and output the data clock or a clock acquired by delaying the data clock.
摘要:
A method and apparatus is capable of processing a sensory effect of image data. The apparatus includes an image analyzer that analyzes depth information and texture information about at least one object included in an image. A motion analyzer analyzes a motion of a user. An image matching processor matches the motion of the user to the image. An image output unit outputs the image to which the motion of the user is matched, and a sensory effect output unit outputs a texture of an object touched by the body of the user to the body of the user.
摘要:
An error code pattern generation circuit includes a first storage unit configured to store at least one bit of an error code, and output error data for a first time period; and a second storage unit configured to store at least one remaining bit of the error code and output the error data for a second time period which is different from the first time period.
摘要:
A semiconductor device for applying an auto clock alignment training mode to reduce the time required for a clock alignment training operation. The semiconductor device adjusts the entry time of the auto clock alignment training mode to prevent the clock alignment training operation from malfunctioning. The semiconductor device includes a clock division block configured to divide a data clock to generate a data division clock, a phase multiplex block configured to generate a plurality of multiple data division clocks in response to the data division clock, a logic level control block configured to set a period, in which a division control signal is changeable, depending on the data division clock, and a first phase detection block configured to detect a phase of a system clock on the basis of the multiple data division clocks in the period, and to generate the division control signal corresponding to a detection result.
摘要:
Disclosed is a nonvolatile memory device which includes a 3D memory cell array having words lines that extend from a lowest memory cell array layer closest to a substrate to a highest memory cell array layer farthest from the substrate, a voltage generator circuit generating first and second voltage signals, and a row selecting circuit that simultaneously applies the first voltage signal to a selected word line and the second voltage signal to an unselected word line. The selected word line and the unselected word line have different resistances, yet the first voltage signal is applied to the selected word line and the second voltage signal is applied to the unselected word line with a same rising slope over a defined period of time.