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    Stud clip for vertical movement of a roof structure relative to a wall stud
    2.
    发明申请
    Stud clip for vertical movement of a roof structure relative to a wall stud 审中-公开
    用于屋顶结构相对于墙壁立柱运动的螺柱夹

    公开(公告)号：US20080053034A1

    公开(公告)日：2008-03-06

    申请号：US11511231

    申请日：2006-08-29

    Applicant: Henry Thomas Matechuk ,  Rodney Colin Park

    Inventor： Henry Thomas Matechuk ,  Rodney Colin Park

    IPC: E04B1/38

    CPC classification number: E04B1/24 ,  E04B2/767 ,  E04B2/768 ,  E04B2001/2415 ,  E04B2001/2448 ,  E04B2001/2457

    Abstract: A deflection clip and system. The deflection clip includes a rigid cross member having opposite first and second ends. An edge extends therebetween. Substantially parallel first and second flanges extend in a first direction substantially orthogonally from the cross member. The first and second flanges are mounted to the first and second ends respectively. A third flange is mounted to the edge of the cross member and extends in a second direction opposite to the first direction. The first and second flanges are spaced apart a distance substantially equal to the width of a horizontal element such as a track to which at least one vertical stud is slidably mounted so as to slide over exterior surfaces of the element for slidable translation in the first direction of the clip relative to the element. The third flange mounts to upper ends of the stud.

    Abstract translation: 偏转夹和系统。 偏转夹包括具有相对的第一和第二端的刚性横向构件。 边缘之间延伸。 基本上平行的第一和第二凸缘在大致正交的第一方向上从横梁延伸。 第一和第二凸缘分别安装到第一和第二端。 第三凸缘安装到横向构件的边缘并沿与第一方向相反的第二方向延伸。 第一和第二凸缘间隔开一个基本上等于诸如轨道的水平元件的宽度的距离，至少一个垂直柱可滑动地安装在该轨道上，以便在元件的外表面上滑动，以在第一方向上滑动 相对于元素的剪辑。 第三个法兰安装在螺柱的上端。

    Charged particle spectrometer and detector therefor
    3.
    发明申请
    Charged particle spectrometer and detector therefor 有权
    带电粒子光谱仪及其检测器

    公开(公告)号：US20060060770A1

    公开(公告)日：2006-03-23

    申请号：US10533570

    申请日：2003-11-04

    Applicant: Simon Page ,  Colin Park ,  Christopher Hopper

    Inventor： Simon Page ,  Colin Park ,  Christopher Hopper

    IPC: B01D59/44 ,  G01N23/00

    CPC classification number: H01J49/48

    Abstract: A charged particle (e.g. photoelectron) spectrometer is operable in a first mode to produce an energy spectrum relating to the composition of a sample being analysed, and in a second mode to produce a charged particle image of the surface of the sample being analysed. A detector is used to detect charged particles produced in both modes of operation. A method of operation of the spectrometer includes the step of selecting which of said first and second modes to use and the detector being operated accordingly.

    Abstract translation: 带电粒子（例如光电子）光谱仪可在第一模式下操作以产生与所分析的样品的组成相关的能谱，并且在第二模式中产生被分析的样品的表面的带电粒子图像。 检测器用于检测在两种操作模式下产生的带电粒子。 光谱仪的操作方法包括以下步骤：选择要使用的所述第一和第二模式中的哪一种，并且相应地操作检测器。

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