公开(公告)号：US09519007B2

公开(公告)日：2016-12-13

申请号：US13753706

申请日：2013-01-30

申请人： Chi Wah Cheng ,  Wang Lung Tse ,  Chi Kit Cheung ,  Cho Tao Cheung

发明人： Chi Wah Cheng ,  Wang Lung Tse ,  Chi Kit Cheung ,  Cho Tao Cheung

IPC分类号： G01R31/01 ,  G01R1/02 ,  G01R31/28

CPC分类号： G01R1/02 ,  G01R31/01 ,  G01R31/2891 ,  G01R31/2893

摘要： A handling system for testing electronic components comprises a rotary turret and pick heads mounted on the rotary turret, each pick head being configured to hold a respective electronic component provided by a supply source. A carrier system which is positionable adjacent to the rotary turret is configured to carry a plurality of electronic components. The carrier system is receivable by a testing station that is operative to simultaneously test a plurality of the electronic components which have been arranged on the carrier system. The pick heads or other transfer mechanism may transfer the electronic components onto the carrier system prior to testing the same at the testing station and remove electronic components from the carrier system after testing the same at the testing station.

摘要翻译： 用于测试电子部件的处理系统包括安装在旋转转台上的旋转转台和拾取头，每个拾取头构造成保持由供应源提供的相应电子部件。 可相对于旋转转台定位的载体系统构造成承载多个电子部件。 载波系统可由测试台接收，该测试台可操作以同时测试已经布置在载波系统上的多个电子部件。 拾取头或其他传送机构可以在测试台进行测试之前将电子部件转移到载体系统上，并在测试台上对其进行测试之后从载体系统中移除电子部件。

公开(公告)号：US20130207679A1

公开(公告)日：2013-08-15

申请号：US13753706

申请日：2013-01-30

申请人： Chi Wah CHENG ,  Wang Lung TSE ,  Chi Kit CHEUNG ,  Cho Tao CHEUNG

发明人： Chi Wah CHENG ,  Wang Lung TSE ,  Chi Kit CHEUNG ,  Cho Tao CHEUNG

IPC分类号： G01R1/02

CPC分类号： G01R1/02 ,  G01R31/01 ,  G01R31/2891 ,  G01R31/2893

摘要： A handling system for testing electronic components comprises a rotary turret and pick heads mounted on the rotary turret, each pick head being configured to hold a respective electronic component provided by a supply source. A carrier system which is positionable adjacent to the rotary turret is configured to carry a plurality of electronic components. The carrier system is receivable by a testing station that is operative to simultaneously test a plurality of the electronic components which have been arranged on the carrier system. The pick heads or other transfer mechanism may transfer the electronic components onto the carrier system prior to testing the same at the testing station and remove electronic components from the carrier system after testing the same at the testing station.

摘要翻译： 用于测试电子部件的处理系统包括安装在旋转转台上的旋转转台和拾取头，每个拾取头构造成保持由供应源提供的相应电子部件。 可相对于旋转转台定位的载体系统构造成承载多个电子部件。 载波系统可由测试台接收，该测试台可操作以同时测试已经布置在载波系统上的多个电子部件。 拾取头或其他传送机构可以在测试台进行测试之前将电子部件转移到载体系统上，并在测试台上对其进行测试之后从载体系统中移除电子部件。