Apparatus and method for measuring flying height and a real index of refraction
    1.
    发明授权
    Apparatus and method for measuring flying height and a real index of refraction 有权
    用于测量飞行高度和实际折射率的装置和方法

    公开(公告)号:US06184992B2

    公开(公告)日:2001-02-06

    申请号:US09248164

    申请日:1999-02-09

    IPC分类号: G01B1102

    CPC分类号: G01N21/41

    摘要: An apparatus that can measure a space between a first surface and a second surface. The apparatus may include a light source that can reflect a light beam from the first and second surfaces. A birefringent element may split the reflected light beam into an ordinary beam and an extraordinary beam. The ordinary and extraordinary beams are detected by a photodetector. The apparatus may include a controller that is coupled to the photodetector and which can compute the space from a phase value that is determined from data collected when the mechanism varies the phase between the ordinary and extraordinary beams, and a ratio between a first modulation amplitude detected from light reflected from the first and second surfaces and a second modulation amplitude detected from light reflected from the first surface when the second surface is not adjacent to the first surface. The ratio can also be used to compute the reflectance and index of refraction of the second surface. This method thus allows the space to be computed without performing a separate measurement to determine the index of refraction.

    摘要翻译: 一种可以测量第一表面和第二表面之间的空间的装置。 该装置可以包括能够反射来自第一和第二表面的光束的光源。 双折射元件可以将反射光束分裂成普通光束和非常光束。 普通和非凡光束由光电检测器检测。 该装置可以包括耦合到光电检测器的控制器,该控制器可以根据当机构改变普通光束和非常光束之间的相位而收集的数据确定的相位值以及检测到的第一调制幅度之间的比值来计算空间 从第一表面和第二表面反射的光和从第一表面反射的光检测的第二调制幅度当第二表面不与第一表面相邻时。 该比率也可用于计算第二表面的反射率和折射率。 因此,该方法允许在不执行单独测量以计算折射率的情况下计算空间。

    LTM compensation methods and systems for magnetic servo writing
    2.
    发明授权
    LTM compensation methods and systems for magnetic servo writing 失效
    用于磁伺服写入的LTM补偿方法和系统

    公开(公告)号:US07428118B2

    公开(公告)日:2008-09-23

    申请号:US11288684

    申请日:2005-11-28

    申请人: Carlos A. Durán

    发明人: Carlos A. Durán

    IPC分类号: G11B21/10

    CPC分类号: G11B5/584

    摘要: Methods and systems are provided for writing a magnetic servo track. In one example, a system includes a head assembly having first and second write elements, and a controller. The controller operable to receive a position signal associated with a position of the magnetic storage medium and energize the first write element to write a first magnetic servo pattern (e.g., repeating servo frames including a tone field). The controller is further operable to energize the second write element to write a second magnetic servo pattern (e.g., a mid-frame mark) at least partially overlapping the first pattern, wherein the relative position of the second pattern is adjusted in response to the position signal. The second pattern may be displaced relative to the first pattern in response to a lateral displacement of the magnetic storage medium to maintain a desired center line condition of the servo track.

    摘要翻译: 提供了用于写入磁性伺服磁道的方法和系统。 在一个示例中,系统包括具有第一和第二写元件的头组件和控制器。 所述控制器可操作以接收与所述磁存储介质的位置相关联的位置信号,并激励所述第一写入元件以写入第一磁性伺服模式(例如,重复包含色调场的伺服帧)。 所述控制器还可操作以对所述第二写入元件通电以写入至少部分地与所述第一图案重叠的第二磁性伺​​服图案(例如,中间帧标记),其中响应于所述位置来调整所述第二图案的相对位置 信号。 响应于磁存储介质的横向位移,第二图案可以相对于第一图案移位,以维持伺服轨迹的期望中心线条件。

    Apparatus for measuring a small gap using a Savart plate
    3.
    发明授权
    Apparatus for measuring a small gap using a Savart plate 有权
    使用Savart板测量小间隙的装置

    公开(公告)号:US06184993B2

    公开(公告)日:2001-02-06

    申请号:US09248182

    申请日:1999-02-09

    IPC分类号: G01B1102

    CPC分类号: G11B7/122 G01B11/14

    摘要: An apparatus that can measure a space between a first surface and a second surface such as the air bearing between a slider and a disk. The apparatus may include a light source that can reflect a light beam from the slider and the disk. By way of example, the light beam can be reflected off of an Al2O3 cap of a slider. A birefringent element such as a Savart plate may split the reflected light beam into an ordinary beam and an extraordinary beam. The ordinary and extraordinary beams may combine to form an interference pattern that is detected by a photodetector. A controller receives data from the photodetector. The apparatus may have a mechanism which can vary a phase between the ordinary and extraordinary beams so that the controller can calculate a phase value &phgr;. The controller then computes the space from the phase value &phgr;. The variation in phase between the beams may be created by tilting the birefringent element, or moving the reflected light beam directed into the birefringent element. The apparatus can determine the space without performing a retract calibration routine that moves the slider as is required in the prior art.

    摘要翻译: 可以测量第一表面和第二表面之间的空间的装置,例如滑块和盘之间的空气轴承。 该装置可以包括可以反射来自滑块和盘的光束的光源。 作为示例,光束可以从滑块的Al 2 O 3盖反射。 诸如萨瓦特板之类的双折射元件可以将反射光束分裂成普通光束和非常光束。 普通和非常的光束可以组合以形成由光电检测器检测到的干涉图案。 控制器从光电检测器接收数据。 该装置可以具有可以改变普通光束和非常光束之间的相位的机构,使得控制器可以计算相位值phi。 然后,控制器从相位值phi计算空间。 可以通过倾斜双折射元件或者将引导到双折射元件的反射光束移动来产生光束之间的相位变化。 该装置可以确定空间,而不执行如现有技术中所需的移动滑块的缩回校准例程。