Method for requesting trace data reports from FDC semiconductor fabrication processes
    1.
    发明授权
    Method for requesting trace data reports from FDC semiconductor fabrication processes 失效
    从FDC半导体制造工艺请求跟踪数据报告的方法

    公开(公告)号:US06871112B1

    公开(公告)日:2005-03-22

    申请号:US09479852

    申请日:2000-01-07

    CPC classification number: H01L22/20 H01L2924/0002 H01L2924/00

    Abstract: The invention is, in its various aspects, a method and apparatus for dynamically generating trace data reports in a semiconductor fabrication process employing fault detection control. The method comprises specifying data including at least one of a parameter, a trigger, and a frequency, for a trace data report; automatically generating from a fault detection controller a request including the specified data to a report generator; formulating the trace data report responsive to the request; and returning the formulated trace data report from the report generator based on the request. The apparatus is a semiconductor fabrication processing system, comprising: a fabrication tool capable of providing at least one of specified data and a trace data report; a fault detection controller capable of automatically generating a request for the trace data report, the request including the specified data; a report generator capable of requesting at least one of the specified data and the trace data report from the fabrication tool and capable of, if the specified data is requested from the fabrication tool, providing the trace data report; and an operator interface for receiving data specified for the trace data report, the specified data including at least one of a parameter, a trigger, and a frequency for the trace data report, and to which the trace data report may be returned from at least one of the report generator and the fabrication tool.

    Abstract translation: 本发明在其各个方面是一种用于在采用故障检测控制的半导体制造过程中动态产生跟踪数据报告的方法和装置。 该方法包括指定用于跟踪数据报告的包括参数,触发和频率中的至少一个的数据; 从故障检测控制器自动生成包括指定数据的请求到报告生成器; 根据请求制定跟踪数据报告; 并根据请求从报告生成器返回已制定的跟踪数据报告。 该装置是半导体制造处理系统,包括:能够提供指定数据和跟踪数据报告中的至少一个的制造工具; 一个故障检测控制器,能够自动产生跟踪数据报告的请求,该请求包括指定的数据; 报告发生器,其能够从所述制造工具请求所述指定数据和跟踪数据报告中的至少一个,并且如果从所述制造工具请求指定的数据,则能够提供所述跟踪数据报告; 以及用于接收为跟踪数据报告指定的数据的操作者界面,所述指定数据包括用于跟踪数据报告的参数,触发和频率中的至少一个,并且跟踪数据报告至少可以从其返回 报告生成器和制作工具之一。

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