Method of testing electronic components
    1.
    发明授权
    Method of testing electronic components 有权
    电子元件测试方法

    公开(公告)号:US08947115B2

    公开(公告)日:2015-02-03

    申请号:US13042738

    申请日:2011-03-08

    CPC分类号: G01R31/2881 G01R31/305

    摘要: A method for testing the sensitivity of electronic components and circuits against particle and photon beams using plasma acceleration, in which the flexibility of the multifaceted interaction can produce several types of radiation such as electron, proton, ion, neutron and photon radiation, and combinations of these types of radiation, in a wide range of parameters that are relevant to the use of electronic components in space, such as satellites, at high altitudes or in facilities that work with radioactive substances such as nuclear power plants. Relevant radiation parameter ranges are accessible by this method, which are hardly accessible with conventional accelerator technology. Because of the compactness of the procedure and its versatility, radiation testing can be performed in smaller laboratories at relatively low cost.

    摘要翻译: 使用等离子加速度来测试电子部件和电路对粒子和光子束的灵敏度的方法,其中多面相互作用的灵活性可以产生几种类型的辐射,例如电子,质子,离子,中子和光子辐射,以及组合 这些类型的辐射在与在空间中使用电子部件(例如高空的电子部件)或与放射性物质如核电厂一起工作的设施相关的广泛的参数中。 通过这种方法可以获得相关的辐射参数范围,这些方法几乎不能用传统的加速器技术进行。 由于程序的紧凑性及其多功能性,辐射测试可以在较小的实验室以较低的成本进行。

    METHOD OF TESTING ELECTRONIC COMPONENTS
    2.
    发明申请
    METHOD OF TESTING ELECTRONIC COMPONENTS 有权
    测试电子元件的方法

    公开(公告)号:US20110240888A1

    公开(公告)日:2011-10-06

    申请号:US13042738

    申请日:2011-03-08

    IPC分类号: B01J19/12 B01J19/08

    CPC分类号: G01R31/2881 G01R31/305

    摘要: A method for testing the sensitivity of electronic components and circuits against particle and photon beams using plasma acceleration, in which the flexibility of the multifaceted interaction can produce several types of radiation such as electron, proton, ion, neutron and photon radiation, and combinations of these types of radiation, in a wide range of parameters that are relevant to the use of electronic components in space, such as satellites, at high altitudes or in facilities that work with radioactive substances such as nuclear power plants. Relevant radiation parameter ranges are accessible by this method, which are hardly accessible with conventional accelerator technology. Because of the compactness of the procedure and its versatility, radiation testing can be performed in smaller laboratories at relatively low cost.

    摘要翻译: 使用等离子加速度来测试电子部件和电路对粒子和光子束的灵敏度的方法,其中多面相互作用的灵活性可以产生几种类型的辐射,例如电子,质子,离子,中子和光子辐射,以及组合 这些类型的辐射在与在空间中使用电子部件(例如高空的电子部件)或与放射性物质如核电厂一起工作的设施相关的广泛的参数中。 通过这种方法可以获得相关的辐射参数范围,这些方法几乎不能用传统的加速器技术进行。 由于程序的紧凑性及其多功能性,辐射测试可以在较小的实验室以较低的成本进行。